F. Julien

	2011
2		Y. Joly, L. Truphemus, Laurent Lopez, Jean Michel Portal, Hassen Aziza, F. Julien, Pascal Fornara: Temperature and hump effect impact on output voltage spread of low power bandgap designed in the sub-threshold area. ISCAS 2011: 2549-2552
1		Y. Joly, Laurent Lopez, Jean Michel Portal, Hassen Aziza, Jean-Luc Ogier, Y. Bert, F. Julien, Pascal Fornara: Matching degradation of threshold voltage and gate voltage of NMOSFET after Hot Carrier Injection stress. Microelectronics Reliability 51(9-11): 1561-1563 (2011)

Coauthor Index

1	Hassen Aziza	[1] [2]
2	Y. Bert	[1]
3	Pascal Fornara	[1] [2]
4	Y. Joly	[1] [2]
5	Laurent Lopez	[1] [2]
6	Jean-Luc Ogier	[1]
7	Jean Michel Portal	[1] [2]
8	L. Truphemus	[2]

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