Patrick Juliano

	2001
2		Jie Wu, Patrick Juliano, Elyse Rosenbaum: Breakdown and latent damage of ultra-thin gate oxides under ESD stress conditions. Microelectronics Reliability 41(11): 1771-1779 (2001)
1		Yu Wang, Patrick Juliano, Sopan Joshi, Elyse Rosenbaum: Electrothermal model for simulation of bulk-Si and SOI diodes in ESD protection circuits. Microelectronics Reliability 41(11): 1781-1787 (2001)

Coauthor Index

1	Sopan Joshi	[1]
2	Elyse Rosenbaum	[1] [2]
3	Yu Wang	[1]
4	Jie Wu	[2]

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