H. F. F. Jos

	2005
1		N. Nenadovic, V. Cuoco, S. J. C. H. Theeuwen, L. K. Nanver, H. Schellevis, G. Spierings, H. F. F. Jos, J. W. Slotboom: Electrothermal characterization of silicon-on-glass VDMOSFETs. Microelectronics Reliability 45(3-4): 541-550 (2005)

Coauthor Index

1	V. Cuoco	[1]
2	L. K. Nanver	[1]
3	N. Nenadovic	[1]
4	H. Schellevis	[1]
5	J. W. Slotboom	[1]
6	G. Spierings	[1]
7	S. J. C. H. Theeuwen	[1]

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