Peter C. de Jong

	2010
3		Guido Notermans, Theo Smedes, Zeljko Mrcarica, Peter C. de Jong, Ralph Stephan, Hans van Zwol, Dejan M. Maksimovic: ESD protection for thin gate oxides in 65 nm. Microelectronics Reliability 50(1): 26-31 (2010)
	2009
2		Guido Notermans, Olivier Quittard, Anco Heringa, Zeljko Mrcarica, Fabrice Blanc, Hans van Zwol, Theo Smedes, Thomas Keller, Peter C. de Jong: ESD robust high-voltage active clamps. Microelectronics Reliability 49(12): 1433-1439 (2009)
	2005
1		M. S. B. Sowariraj, Theo Smedes, Peter C. de Jong, Cora Salm, Ton J. Mouthaan, Fred G. Kuper: A 3-D Circuit Model to evaluate CDM performance of ICs. Microelectronics Reliability 45(9-11): 1425-1429 (2005)

Coauthor Index

1	Fabrice Blanc	[2]
2	Anco Heringa	[2]
3	Thomas Keller	[2]
4	Fred G. Kuper	[1]
5	Dejan M. Maksimovic	[3]
6	Ton J. Mouthaan	[1]
7	Zeljko Mrcarica	[2] [3]
8	Guido Notermans	[2] [3]
9	Olivier Quittard	[2]
10	Cora Salm	[1]
11	Theo Smedes	[1] [2] [3]
12	M. S. B. Sowariraj	[1]
13	Ralph Stephan	[3]
14	Hans van Zwol	[2] [3]

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