 | 2009 |
| 3 |  | R. Boumen,
Ivo S. M. de Jong,
J. M. G. Mestrom,
J. M. van de Mortel-Fronczak,
J. E. Rooda:
Integration and Test Sequencing for Complex Systems.
IEEE Transactions on Systems, Man, and Cybernetics, Part A 39(1): 177-187 (2009) |
| 2 |  | Anne Rozinat,
Ivo S. M. de Jong,
Christian W. Günther,
Wil M. P. van der Aalst:
Process Mining Applied to the Test Process of Wafer Scanners in ASML.
IEEE Transactions on Systems, Man, and Cybernetics, Part C 39(4): 474-479 (2009) |
| 2008 |
| 1 |  | R. Boumen,
Ivo S. M. de Jong,
J. W. H. Vermunt,
J. M. van de Mortel-Fronczak,
J. E. Rooda:
Test Sequencing in Complex Manufacturing Systems.
IEEE Transactions on Systems, Man, and Cybernetics, Part A 38(1): 25-37 (2008) |