B. K. Jones

	2002
3		B. K. Jones: Logarithmic distributions in reliability analysis. Microelectronics Reliability 42(4-5): 779-786 (2002)
	2001
2		B. K. Jones, C. N. Graham, A. Konczakowska, L. Hasse: The coherence of the gate and drain noise in stressed AlGaAs-InAlGaAs PHEMTs. Microelectronics Reliability 41(1): 87-97 (2001)
	1988
1		A. P. Dorey, B. K. Jones, Andrew M. D. Richardson, P. C. Russell, Y. Z. Xu: Reliability Testing by Precise Electrical Measurement. ITC 1988: 369-373

Coauthor Index

1	A. P. Dorey	[1]
2	C. N. Graham	[2]
3	L. Hasse	[2]
4	A. Konczakowska	[2]
5	Andrew M. D. Richardson	[1]
6	P. C. Russell	[1]
7	Y. Z. Xu	[1]

Colors in the list of coauthors

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