Robert S. Johnson

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2001

1 Gerald Lucovsky, Gilbert B. Rayner, Robert S. Johnson: Chemical and physical limits on the performance of metal silicate high-k gate dielectrics. Microelectronics Reliability 41(7): 937-945 (2001)

	2001
1		Gerald Lucovsky, Gilbert B. Rayner, Robert S. Johnson: Chemical and physical limits on the performance of metal silicate high-k gate dielectrics. Microelectronics Reliability 41(7): 937-945 (2001)

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