Chikateru Jinno

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2002

1 Michiko Inoue, Chikateru Jinno, Hideo Fujiwara: An Extended Class of Sequential Circuits with Combinational Test Generation Complexity. ICCD 2002: 200-205

	2002
1		Michiko Inoue, Chikateru Jinno, Hideo Fujiwara: An Extended Class of Sequential Circuits with Combinational Test Generation Complexity. ICCD 2002: 200-205

Coauthor Index

1 Hideo Fujiwara [1]

2 Michiko Inoue [1]

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