Le Jin

	2011
27		Le Jin: Application of the Kalman Filter in Linearity Testing of Analog-to-Digital Converters. J. Electronic Testing 27(2): 163-175 (2011)
	2010
26		Jingbo Duan, Le Jin, Degang Chen: INL based dynamic performance estimation for ADC BIST. ISCAS 2010: 3028-3031
25		Jingbo Duan, Le Jin, Degang Chen: A new method for estimating spectral performance of ADC from INL. ITC 2010: 694-703
	2009
24		S. Kook, Hyun Choi, Vishwanath Natarajan, Abhijit Chatterjee, Alfred V. Gomes, Shalabh Goyal, Le Jin: Low Cost Dynamic Test Methodology for High Precision ΣD ADCs. Asian Test Symposium 2009: 69-74
23		Jin Yu, Limin Zhi, Yunming Qiu, Le Jin, Hailu Du: Grey Synthetical Prediction Model of Military Logistics Based on Evolutionary Neural Network. CSO (1) 2009: 663-665
22		S. Kook, Vishwanath Natarajan, Abhijit Chatterjee, Shalabh Goyal, Le Jin: Testing of High Resolution ADCs Using Lower Resolution DACs via Iterative Transfer Function Estimation. European Test Symposium 2009: 3-8
21		Le Jin, Degang Chen, Randall L. Geiger: Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal. IEEE T. Instrumentation and Measurement 58(8): 2679-2685 (2009)
	2008
20		Hanqing Xing, Degang Chen, Randall L. Geiger, Le Jin: System identification -based reduced-code testing for pipeline ADCs' linearity test. ISCAS 2008: 2402-2405
19		Le Jin: Linearity Test Time Reduction for Analog-to-Digital Converters Using the Kalman Filter with Experimental Parameter Estimation. ITC 2008: 1-8
18		Le Jin, Hosam Haggag, Randall L. Geiger, Degang Chen: Testing of Precision DAC Using Low-Resolution ADC With Wobbling. IEEE T. Instrumentation and Measurement 57(5): 940-946 (2008)
17		Liang Chen, Le Jin, Feng He, Hanwen Cheng, Lenan Wu: Dynamic Network Selection for Multicast Services in Wireless Cooperative Networks. IEICE Transactions 91-B(10): 3069-3076 (2008)
	2007
16		Le Jin, Degang Chen, Randall L. Geiger: Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal. VTS 2007: 303-310
15		Le Jin, Degang Chen, Randall L. Geiger: SEIR Linearity Testing of Precision A/D Converters in Nonstationary Environments With Center-Symmetric Interleaving. IEEE T. Instrumentation and Measurement 56(5): 1776-1785 (2007)
	2006
14		Le Jin, Hanqing Xing, Degang Chen, Randall L. Geiger: A self-calibrated bandgap voltage reference with 0.5 ppm/°C temperature coefficient. ISCAS 2006
13		Hanqing Xing, Le Jin, Degang Chen, Randall L. Geiger: Characterization of a current-mode bandgap circuit structure for high-precision reference applications. ISCAS 2006
12		Le Jin, Hosam Haggag, Randall L. Geiger, Degang Chen: Testing of Precision DACs Using Low-Resolution ADCs with Dithering. ITC 2006: 1-10
11		Le Jin, Degang Chen, Randall L. Geiger: Linearity Test of Analog-to-Digital Converters Using Kalman Filtering. ITC 2006: 1-9
	2005
10		Le Jin, Degang Chen, Randall L. Geiger: A digital self-calibration algorithm for ADCs based on histogram test using low-linearity input signals. ISCAS (2) 2005: 1378-1381
9		Wenbo Liu, Hanqing Xing, Le Jin, Randall L. Geiger, Degang Chen: A test strategy for time-to-digital converters using dynamic element matching and dithering. ISCAS (4) 2005: 3809-3812
8		Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Randall L. Geiger, Degang Chen: High-performance ADC linearity test using low-precision signals in non-stationary environments. ITC 2005: 10
7		Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger: Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removal. IEEE T. Instrumentation and Measurement 54(3): 1188-1199 (2005)
	2004
6		Chengming He, Le Jin, Degang Chen, Randall L. Geiger: Robust design of high gain amplifiers using dynamical systems and bifurcation theory. ISCAS (1) 2004: 481-484
5		Le Jin, Chengming He, Degang Chen, Randall L. Geiger: An SoC compatible linearity test approach for precision ADCs using easy-to-generate sinusoidal stimuli. ISCAS (1) 2004: 928-931
4		Le Jin, Chengming He, Degang Chen, Randall L. Geiger: Fast implementation of a linearity test approach for high-resolution ADCs using non-linear ramp signals. ISCAS (1) 2004: 932-935
	2003
3		Kumar L. Parthasarathy, Le Jin, Turker Kuyel, Dana Price, Degang Chen, Randall L. Geiger: Experimental evaluation and validation of a BIST algorithm for characterization of A/D converter performance. ISCAS (5) 2003: 537-540
2		Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger: Linearity Testing of Precision Analog-to-Digital Converters Using Stationary Nonlinear Inputs. ITC 2003: 218-227
1		Kumar L. Parthasarathy, Turker Kuyel, Dana Price, Le Jin, Degang Chen, Randall L. Geiger: BIST and production testing of ADCs using imprecise stimulus. ACM Trans. Design Autom. Electr. Syst. 8(4): 522-545 (2003)

Coauthor Index

1	Abhijit Chatterjee	[22] [24]
2	Degang Chen	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [18] [20] [21] [25] [26]
3	Liang Chen	[17]
4	Hanwen Cheng	[17]
5	Hyun Choi	[24]
6	Hailu Du	[23]
7	Jingbo Duan	[25] [26]
8	Randall L. Geiger	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [18] [20] [21]
9	Alfred V. Gomes	[24]
10	Shalabh Goyal	[22] [24]
11	Hosam Haggag	[12] [18]
12	Chengming He	[4] [5] [6]
13	Feng He	[17]
14	S. Kook	[22] [24]
15	Turker Kuyel	[1] [2] [3] [7] [8]
16	Wenbo Liu	[9]
17	Vishwanath Natarajan	[22] [24]
18	Kumar L. Parthasarathy	[1] [2] [3] [7] [8]
19	Dana Price	[1] [3]
20	Yunming Qiu	[23]
21	Lenan Wu	[17]
22	Hanqing Xing	[9] [13] [14] [20]
23	Jin Yu	[23]
24	Limin Zhi	[23]

Colors in the list of coauthors

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