Zhigang Jiang

	2011
12		Shianling Wu, Laung-Terng Wang, Xiaoqing Wen, Zhigang Jiang, Lang Tan, Yu Zhang, Yu Hu, Wen-Ben Jone, Michael S. Hsiao, James Chien-Mo Li, Jiun-Lang Huang, Lizhen Yu: Using Launch-on-Capture for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains. IEEE Trans. on CAD of Integrated Circuits and Systems 30(3): 455-463 (2011)
	2010
11		Gongfa Li, Jianyi Kong, Guozhang Jiang, Hua Zhang, Zhigang Jiang, Gang Zhao, Liangxi Xie: Energy Efficiency Evaluation for Iron and Steel High Energy Consumption Enterprise. ISIA 2010: 684-690
10		Laung-Terng Wang, Nur A. Touba, Zhigang Jiang, Shianling Wu, Jiun-Lang Huang, James Chien-Mo Li: CSER: BISER-based concurrent soft-error resilience. VTS 2010: 153-158
	2009
9		Zhigang Jiang, Sandeep K. Gupta: Threshold Testing: Improving Yield for Nanoscale VLSI. IEEE Trans. on CAD of Integrated Circuits and Systems 28(12): 1883-1895 (2009)
	2008
8		Shianling Wu, Laung-Terng Wang, Zhigang Jiang, Jiayong Song, Boryau Sheu, Xiaoqing Wen, Michael S. Hsiao, James Chien-Mo Li, Jiun-Lang Huang, Ravi Apte: On Optimizing Fault Coverage, Pattern Count, and ATPG Run Time Using a Hybrid Single-Capture Scheme for Testing Scan Designs. DFT 2008: 143-151
7		Laung-Terng Wang, Xiaoqing Wen, Shianling Wu, Zhigang Wang, Zhigang Jiang, Boryau Sheu, Xinli Gu: VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG. IEEE Design & Test of Computers 25(2): 122-130 (2008)
	2006
6		Hiroshi Furukawa, Xiaoqing Wen, Laung-Terng Wang, Boryau Sheu, Zhigang Jiang, Shianling Wu: A Novel and Practical Control Scheme for Inter-Clock At-Speed Testing. ITC 2006: 1-10
	2005
5		Zhigang Jiang, Sandeep K. Gupta: Threshold testing: Covering bridging and other realistic faults. Asian Test Symposium 2005: 390-397
4		Shianling Wu, Laung-Terng Wang, Jin Woo Cho, Zhigang Jiang, Boryau Sheu: Test compression and logic BIST at your fingertips. ITC 2005: 2
	2003
3		Zhigang Jiang, Sandeep K. Gupta: A Test Generation Approach for Systems-on-Chip that Use Intellectual Property Cores. Asian Test Symposium 2003: 278-283
2		Md. Saffat Quasem, Zhigang Jiang, Sandeep K. Gupta: Benefits of a SoC-Specific Test Methodology. IEEE Design & Test of Computers 20(3): 68-77 (2003)
	2002
1		Zhigang Jiang, Sandeep K. Gupta: An ATPG for Threshold Testing: Obtaining Acceptable Yield in Future Processes. ITC 2002: 824-833

Coauthor Index

1	Ravi Apte	[8]
2	Jin Woo Cho	[4]
3	Hiroshi Furukawa	[6]
4	Xinli Gu	[7]
5	Sandeep K. Gupta	[1] [2] [3] [5] [9]
6	Michael S. Hsiao	[8] [12]
7	Yu Hu	[12]
8	Jiun-Lang Huang	[8] [10] [12]
9	Guozhang Jiang	[11]
10	Wen-Ben Jone	[12]
11	Jianyi Kong	[11]
12	Chien-Mo James Li (James Chien-Mo Li, J. C.-M. Li)	[8] [10] [12]
13	Gongfa Li	[11]
14	Md. Saffat Quasem	[2]
15	Boryau Sheu	[4] [6] [7] [8]
16	Jiayong Song	[8]
17	Lang Tan	[12]
18	Nur A. Touba	[10]
19	Laung-Terng Wang	[4] [6] [7] [8] [10] [12]
20	Zhigang Wang	[7]
21	Xiaoqing Wen	[6] [7] [8] [12]
22	Shianling Wu	[4] [6] [7] [8] [10] [12]
23	Liangxi Xie	[11]
24	Lizhen Yu	[12]
25	Hua Zhang	[11]
26	Yu Zhang	[12]
27	Gang Zhao	[11]

Colors in the list of coauthors

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