 | 2010 |
|---|
| 6 |       | Jae-Seong Jeong,
Soon Ghon Kim:
An Efficient Method for Game Development using Compiler.
ICEIS (3) 2010: 447-450 |
| 5 |  | Jae-Seong Jeong,
Young Jeon Kim:
Failure mechanism of COF based Line Driver IC for Flat Panel Display by contamination.
Microelectronics Reliability 50(9-11): 1488-1493 (2010) |
| 2009 |
|---|
| 4 | | Jae-Seong Jeong,
Sang-Deuk Park:
Failure analysis of video processor defined as No Fault Found (NFF): Reproduction in system level and advanced analysis technique in IC level.
Microelectronics Reliability 49(9-11): 1153-1157 (2009) |
| 2008 |
|---|
| 3 | | Jae-Seong Jeong,
Jin-Kyu Jung,
Sang-Deuk Park:
Reliability improvement of InGaN LED backlight module by accelerated life test (ALT) and screen policy of potential leakage LED.
Microelectronics Reliability 48(8-9): 1216-1220 (2008) |
| 2007 |
|---|
| 2 | | Jae-Seong Jeong,
Soon-Ha Hong,
Sang-Deuk Park:
Field failure mechanism and improvement of EOS failure of integrated IGBT inverter modules.
Microelectronics Reliability 47(9-11): 1795-1799 (2007) |
| 2005 |
|---|
| 1 | | Jae-Seong Jeong,
Jae-Hyun Lee,
Jong-Shin Ha,
Sang-Deuk Park:
Stress Mechanism about Field Lightning Surge of High Voltage BJT Based Line Driver for ADSL System.
Microelectronics Reliability 45(9-11): 1398-1401 (2005) |
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