Seok Hee Jeon

	2005
2		Jong Hun Kim, Kyosun Kim, Seok Hee Jeon, Jong-Tae Park: Reliability improvement by the suppression of keyhole generation in W-plug vias. Microelectronics Reliability 45(9-11): 1455-1458 (2005)
	2003
1		Jong-Tae Park, Nag Jong Choi, Chong-Gun Yu, Seok Hee Jeon, Jean-Pierre Colinge: Increased hot carrier effects in Gate-All-Around SOI nMOSFET's. Microelectronics Reliability 43(9-11): 1427-1432 (2003)

Coauthor Index

1	Nag Jong Choi	[1]
2	Jean-Pierre Colinge	[1]
3	Jong Hun Kim	[2]
4	Kyosun Kim	[2]
5	Jong-Tae Park	[1] [2]
6	Chong-Gun Yu	[1]

Last update Sat Jun 2 20:57:36 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page