Keith A. Jenkins

	2011
10		Karthik Balakrishnan, Keith A. Jenkins, Duane S. Boning: A simple array-based test structure for the AC variability characterization of MOSFETs. ISQED 2011: 539-544
	2009
9		Keith A. Jenkins, Lionel Li: A Scalable, Digital BIST Circuit for Measurement and Compensation of Static Phase Offset. VTS 2009: 185-188
	2008
8		Woogeun Rhee, Keith A. Jenkins, John Liobe, Herschel A. Ainspan: Experimental Analysis of Substrate Noise Effect on PLL Performance. IEEE Trans. on Circuits and Systems 55-II(7): 638-642 (2008)
	2005
7		Anup P. Jose, Keith A. Jenkins, Scott K. Reynolds: On-Chip Spectrum Analyzer for Analog Built-In Self Test. VTS 2005: 131-136
6		John U. Knickerbocker, Paul S. Andry, L. Paivikki Buchwalter, Alina Deutsch, Raymond R. Horton, Keith A. Jenkins, Young Hoon Kwark, Gerald McVicker, Chirag S. Patel, Robert J. Polastre, Christian D. Schuster, Arun Sharma, Sri M. Sri-Jayantha, Christopher W. Surovic, Cornelia K. Tsang, Bucknell C. Webb, Steven L. Wright, Samuel R. McKnight, Edmund J. Sprogis, Bing Dang: Development of next-generation system-on-package (SOP) technology based on silicon carriers with fine-pitch chip interconnection. IBM Journal of Research and Development 49(4-5): 725-754 (2005)
	2004
5		Stas Polonsky, Keith A. Jenkins, Alan J. Weger, Shinho Cho: CMOS IC diagnostics using the luminescence of OFF-state leakage currents. ITC 2004: 134-139
	2003
4		Jean-Olivier Plouchart, Noah Zamdmer, Jonghae Kim, Melanie Sherony, Yue Tan, Asit Ray, Mohamed Talbi, Lawrence F. Wagner, Kun Wu, Naftali E. Lustig, Shreesh Narasimha, Patricia O'Neil, Nghia Phan, Michael Rohn, James Strom, David M. Friend, Stephen V. Kosonocky, Daniel R. Knebel, Suhwan Kim, Keith A. Jenkins, Michel M. Rivier: Application of an SOI 0.12-µm CMOS technology to SoCs with low-power and high-frequency circuits. IBM Journal of Research and Development 47(5-6): 611-630 (2003)
	2000
3		Keith A. Jenkins, James P. Eckhardt: Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops. IEEE Design & Test of Computers 17(2): 86-93 (2000)
	1998
2		Stephen V. Kosonocky, Arthur A. Bright, Kevin W. Warren, Ruud A. Haring, Steve Klepner, Sameh W. Asaad, S. Basavaiah, Bob Havreluk, David F. Heidel, Michael Immediato, Keith A. Jenkins, Rajiv V. Joshi, Benjamin D. Parker, T. V. Rajeevakumar, Kevin G. Stawiasz: Designing a Testable System on a Chip. VTS 1998: 2-7
	1997
1		Keith A. Jenkins: Detecting and Preventing Measurement Errors. IEEE Design & Test of Computers 14(4): 78-86 (1997)

Coauthor Index

1	Herschel A. Ainspan	[8]
2	Paul S. Andry	[6]
3	Sameh W. Asaad	[2]
4	Karthik Balakrishnan	[10]
5	S. Basavaiah	[2]
6	Duane S. Boning	[10]
7	Arthur A. Bright	[2]
8	L. Paivikki Buchwalter	[6]
9	Shinho Cho	[5]
10	Bing Dang	[6]
11	Alina Deutsch	[6]
12	James P. Eckhardt	[3]
13	David M. Friend	[4]
14	Ruud A. Haring	[2]
15	Bob Havreluk	[2]
16	David F. Heidel	[2]
17	Raymond R. Horton	[6]
18	Michael Immediato	[2]
19	Anup P. Jose	[7]
20	Rajiv V. Joshi	[2]
21	Jonghae Kim	[4]
22	Suhwan Kim	[4]
23	Steve Klepner	[2]
24	Daniel R. Knebel	[4]
25	John U. Knickerbocker	[6]
26	Stephen V. Kosonocky	[2] [4]
27	Young Hoon Kwark	[6]
28	Lionel Li	[9]
29	John Liobe	[8]
30	Naftali E. Lustig	[4]
31	Samuel R. McKnight	[6]
32	Gerald McVicker	[6]
33	Shreesh Narasimha	[4]
34	Patricia O'Neil	[4]
35	Benjamin D. Parker	[2]
36	Chirag S. Patel	[6]
37	Nghia Phan	[4]
38	Jean-Olivier Plouchart	[4]
39	Robert J. Polastre	[6]
40	Stas Polonsky	[5]
41	T. V. Rajeevakumar	[2]
42	Asit Ray	[4]
43	Scott K. Reynolds	[7]
44	Woogeun Rhee	[8]
45	Michel M. Rivier	[4]
46	Michael Rohn	[4]
47	Christian D. Schuster	[6]
48	Arun Sharma	[6]
49	Melanie Sherony	[4]
50	Edmund J. Sprogis	[6]
51	Sri M. Sri-Jayantha	[6]
52	Kevin G. Stawiasz	[2]
53	James Strom	[4]
54	Christopher W. Surovic	[6]
55	Mohamed Talbi	[4]
56	Yue Tan	[4]
57	Cornelia K. Tsang	[6]
58	Lawrence F. Wagner	[4]
59	Kevin W. Warren	[2]
60	Bucknell C. Webb	[6]
61	Alan J. Weger	[5]
62	Steven L. Wright	[6]
63	Kun Wu	[4]
64	Noah Zamdmer	[4]

Colors in the list of coauthors

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