 | 2011 |
| 15 |  | Taavi Viilukas,
Maksim Jenihhin,
Jaan Raik,
Raimund Ubar,
Samary Baranov:
Automated test bench generation for high-level synthesis flow ABELITE.
EWDTS 2011: 13-16 |
| 14 |  | Jaan Raik,
Anna Rannaste,
Maksim Jenihhin,
Taavi Viilukas,
Raimund Ubar,
Hideo Fujiwara:
Constraint-Based Hierarchical Untestability Identification for Synchronous Sequential Circuits.
European Test Symposium 2011: 147-152 |
| 2010 |
| 13 |  | Taavi Viilukas,
Jaan Raik,
Maksim Jenihhin,
Raimund Ubar,
Anna Krivenko:
Constraint-based test pattern generation at the Register-Transfer Level.
DDECS 2010: 352-357 |
| 12 |  | Maksim Jenihhin,
Jaan Raik,
Raimund Ubar,
Tatjana Shchenova:
An approach for PSL assertion coverage analysis with high-level decision diagrams.
EWDTS 2010: 13-16 |
| 2009 |
| 11 |  | Maksim Jenihhin,
Jaan Raik,
Anton Chepurov,
Raimund Ubar:
PSL Assertion Checking Using Temporally Extended High-Level Decision Diagrams.
J. Electronic Testing 25(6): 289-300 (2009) |
| 2008 |
| 10 |  | Jaan Raik,
Uljana Reinsalu,
Raimund Ubar,
Maksim Jenihhin,
Peeter Ellervee:
Code Coverage Analysis using High-Level Decision Diagrams.
DDECS 2008: 201-206 |
| 9 |  | Raimund Ubar,
Sergei Devadze,
Maksim Jenihhin,
Jaan Raik,
Gert Jervan,
Peeter Ellervee:
Hierarchical Calculation of Malicious Faults for Evaluating the Fault-Tolerance.
DELTA 2008: 222-227 |
| 8 |  | Witold A. Pleskacz,
Maksim Jenihhin,
Jaan Raik,
Michal Rakowski,
Raimund Ubar,
Wieslaw Kuzmicz:
Hierarchical Analysis of Short Defects between Metal Lines in CMOS IC.
DSD 2008: 729-734 |
| 7 |  | Maksim Jenihhin,
Jaan Raik,
Anton Chepurov,
Raimund Ubar:
Temporally Extended High-Level Decision Diagrams for PSL Assertions Simulation.
European Test Symposium 2008: 61-68 |
| 6 |  | Jaan Raik,
Raimund Ubar,
Taavi Viilukas,
Maksim Jenihhin:
Mixed hierarchical-functional fault models for targeting sequential cores.
Journal of Systems Architecture - Embedded Systems Design 54(3-4): 465-477 (2008) |
| 2007 |
| 5 |  | Maksim Jenihhin,
Jaan Raik,
Raimund Ubar,
Witold A. Pleskacz,
Michal Rakowski:
Layout to Logic Defect Analysis for Hierarchical Test Generation.
DDECS 2007: 35-40 |
| 2006 |
| 4 |  | Gert Jervan,
Petru Eles,
Zebo Peng,
Raimund Ubar,
Maksim Jenihhin:
Test Time Minimization for Hybrid BIST of Core-Based Systems.
J. Comput. Sci. Technol. 21(6): 907-912 (2006) |
| 2004 |
| 3 |  | Raimund Ubar,
Maksim Jenihhin:
Hybrid BIST Optimization for Core-based Systems with Test Pattern Broadcasting.
DELTA 2004: 3-8 |
| 2003 |
| 2 |  | Gert Jervan,
Petru Eles,
Zebo Peng,
Raimund Ubar,
Maksim Jenihhin:
Test Time Minimization for Hybrid BIST of Core-Based Systems.
Asian Test Symposium 2003: 318-325 |
| 1 |  | Gert Jervan,
Petru Eles,
Zebo Peng,
Raimund Ubar,
Maksim Jenihhin:
Hybrid BIST Time Minimization for Core-Based Systems with STUMPS Architecture.
DFT 2003: 225- |