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 | 2002 | |
|---|---|---|
| 5 |      | Alvin Jee: Defect-Oriented Analysis of Memory BIST Tests. IOLTW 2002: 201-205 |
| 4 | | Mark Craig, Alvin Jee, Prashant Maniar: An Integrated Approach to Yield Loss Characterization. ITC 2002: 350-356 |
| 3 | | Alvin Jee: Defect-Oriented Analysis of Memory BIST Tests. MTDT 2002: 7-11 |
| 2001 | ||
| 2 | | Julie Segal, Alvin Jee, David Y. Lepejian, Ben Chu: Using Electrical Bitmap Results from Embedded Memory to Enhance Yield. IEEE Design & Test of Computers 18(3): 28-39 (2001) |
| 2000 | ||
| 1 | | Alvin Jee, Jonathon E. Colburn, V. Swamy Irrinki, Mukesh Puri: Optimizing Memory Tests by Analyzing Defect Coverage. MTDT 2000: 20-28 |
| 1 | Ben Chu | [2] |
| 2 | Jonathon E. Colburn | [1] |
| 3 | Mark Craig | [4] |
| 4 | V. Swamy Irrinki | [1] |
| 5 | David Y. Lepejian | [2] |
| 6 | Prashant Maniar | [4] |
| 7 | Mukesh Puri | [1] |
| 8 | Julie Segal | [2] |
Colors in the list of coauthors
Last update Sat Jun 2 20:57:36 2012 CET by the DBLP Team —
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