Vinay Jayaram

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2007

4 Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram: Transition Delay Fault Test Pattern Generation Considering Supply Voltage Noise in a SOC Design. DAC 2007: 533-538

3 Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram: Supply Voltage Noise Aware ATPG for Transition Delay Faults. VTS 2007: 179-186

2006

2 Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram: Timing-based delay test for screening small delay defects. DAC 2006: 320-325

1 Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram: A novel framework for faster-than-at-speed delay test considering IR-drop effects. ICCAD 2006: 198-203

	2007
4		Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram: Transition Delay Fault Test Pattern Generation Considering Supply Voltage Noise in a SOC Design. DAC 2007: 533-538
3		Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram: Supply Voltage Noise Aware ATPG for Transition Delay Faults. VTS 2007: 179-186
	2006
2		Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram: Timing-based delay test for screening small delay defects. DAC 2006: 320-325
1		Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram: A novel framework for faster-than-at-speed delay test considering IR-drop effects. ICCAD 2006: 198-203

Coauthor Index

Last update Sat Jun 2 20:57:36 2012 CET by the DBLP Team —

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1	Nisar Ahmed	[1] [2] [3] [4]
2	Mohammad Tehranipoor	[1] [2] [3] [4]