 | 2011 |
| 31 |  | Michail Maniatakos,
Chandra Tirumurti,
Abhijit Jas,
Yiorgos Makris:
AVF Analysis Acceleration via Hierarchical Fault Pruning.
European Test Symposium 2011: 87-92 |
| 30 |  | Michail Maniatakos,
Naghmeh Karimi,
Chandra Tirumurti,
Abhijit Jas,
Yiorgos Makris:
Instruction-Level Impact Analysis of Low-Level Faults in a Modern Microprocessor Controller.
IEEE Trans. Computers 60(9): 1260-1273 (2011) |
| 29 |  | Naghmeh Karimi,
Michail Maniatakos,
Abhijit Jas,
Chandra Tirumurti,
Yiorgos Makris:
Workload-Cognizant Concurrent Error Detection in the Scheduler of a Modern Microprocessor.
IEEE Trans. Computers 60(9): 1274-1287 (2011) |
| 2010 |
| 28 |  | Daniele Rossi,
Martin Omaña,
Gianluca Berghella,
Cecilia Metra,
Abhijit Jas,
Chandra Tirumurti,
Rajesh Galivanche:
Low cost and low intrusive approach to test on-line the scheduler of high performance microprocessors.
Conf. Computing Frontiers 2010: 113-114 |
| 27 |  | Debasish Das,
Kip Killpack,
Chandramouli V. Kashyap,
Abhijit Jas,
Hai Zhou:
Pessimism Reduction in Coupling-Aware Static Timing Analysis Using Timing and Logic Filtering.
IEEE Trans. on CAD of Integrated Circuits and Systems 29(3): 466-478 (2010) |
| 2009 |
| 26 |  | Naghmeh Karimi,
Michail Maniatakos,
Chandra Tirumurti,
Abhijit Jas,
Yiorgos Makris:
Impact analysis of performance faults in modern microprocessors.
ICCD 2009: 91-96 |
| 25 |  | Hongxia Fang,
Krishnendu Chakrabarty,
Abhijit Jas,
Srinivas Patil,
Chandra Tirumurti:
RT-Level Deviation-Based Grading of Functional Test Sequences.
VTS 2009: 264-269 |
| 24 |  | Michail Maniatakos,
Naghmeh Karimi,
Chandra Tirumurti,
Abhijit Jas,
Yiorgos Makris:
Instruction-Level Impact Comparison of RT- vs. Gate-Level Faults in a Modern Microprocessor Controller.
VTS 2009: 9-14 |
| 23 |  | Kanupriya Gulati,
Suganth Paul,
Sunil P. Khatri,
Srinivas Patil,
Abhijit Jas:
FPGA-based hardware acceleration for Boolean satisfiability.
ACM Trans. Design Autom. Electr. Syst. 14(2): (2009) |
| 2008 |
| 22 |  | Debasish Das,
Kip Killpack,
Chandramouli V. Kashyap,
Abhijit Jas,
Hai Zhou:
Pessimism reduction in coupling-aware static timing analysis using timing and logic filtering.
ASP-DAC 2008: 486-491 |
| 21 |  | Ramtilak Vemu,
Abhijit Jas,
Jacob A. Abraham,
Srinivas Patil,
Rajesh Galivanche:
A low-cost concurrent error detection technique for processor control logic.
DATE 2008: 897-902 |
| 20 |  | Michail Maniatakos,
Naghmeh Karimi,
Yiorgos Makris,
Abhijit Jas,
Chandra Tirumurti:
Design and Evaluation of a Timestamp-Based Concurrent Error Detection Method (CED) in a Modern Microprocessor Controller.
DFT 2008: 454-462 |
| 19 |  | Cecilia Metra,
Daniele Rossi,
Martin Omaña,
Abhijit Jas,
Rajesh Galivanche:
Function-Inherent Code Checking: A New Low Cost On-Line Testing Approach for High Performance Microprocessor Control Logic.
European Test Symposium 2008: 171-176 |
| 18 |  | Avijit Dutta,
Abhijit Jas:
Combinational Logic Circuit Protection Using Customized Error Detecting and Correcting Codes.
ISQED 2008: 68-73 |
| 17 |  | Naghmeh Karimi,
Michail Maniatakos,
Abhijit Jas,
Yiorgos Makris:
On the Correlation between Controller Faults and Instruction-Level Errors in Modern Microprocessors.
ITC 2008: 1-10 |
| 16 |  | Abhijit Jas,
Yi-Shing Chang,
Sreejit Chakravarty:
A Methodology for Handling Complex Functional Constraints for Large Industrial Designs.
J. Electronic Testing 24(1-3): 259-269 (2008) |
| 2007 |
| 15 |  | Abhijit Jas,
Srinivas Patil:
Analysis of Specified Bit Handling Capability of Combinational Expander Networks.
DFT 2007: 252-260 |
| 2006 |
| 14 |  | Abhijit Jas,
Yi-Shing Chang,
Sreejit Chakravarty:
An Approach to Minimizing Functional Constraints.
DFT 2006: 215-226 |
| 2004 |
| 13 |  | C. V. Krishna,
Abhijit Jas,
Nur A. Touba:
Achieving high encoding efficiency with partial dynamic LFSR reseeding.
ACM Trans. Design Autom. Electr. Syst. 9(4): 500-516 (2004) |
| 12 |  | Abhijit Jas,
C. V. Krishna,
Nur A. Touba:
Weighted pseudorandom hybrid BIST.
IEEE Trans. VLSI Syst. 12(12): 1277-1283 (2004) |
| 11 |  | Abhijit Jas,
Bahram Pouya,
Nur A. Touba:
Test data compression technique for embedded cores using virtual scan chains.
IEEE Trans. VLSI Syst. 12(7): 775-781 (2004) |
| 2003 |
| 10 |  | Abhijit Jas,
Jayabrata Ghosh-Dastidar,
Mom-Eng Ng,
Nur A. Touba:
An efficient test vector compression scheme using selective Huffman coding.
IEEE Trans. on CAD of Integrated Circuits and Systems 22(6): 797-806 (2003) |
| 2002 |
| 9 |  | Abhijit Jas,
Nur A. Touba:
Deterministic Test Vector Compression/Decompression for Systems-on-a-Chip Using an Embedded Processor.
J. Electronic Testing 18(4-5): 503-514 (2002) |
| 2001 |
| 8 |  | C. V. Krishna,
Abhijit Jas,
Nur A. Touba:
Test vector encoding using partial LFSR reseeding.
ITC 2001: 885-893 |
| 7 |  | Abhijit Jas,
C. V. Krishna,
Nur A. Touba:
Hybrid BIST Based on Weighted Pseudo-Random Testing: A New Test Resource Partitioning Scheme.
VTS 2001: 2-8 |
| 2000 |
| 6 |  | Abhijit Jas,
Bahram Pouya,
Nur A. Touba:
Virtual Scan Chains: A Means for Reducing Scan Length in Cores.
VTS 2000: 73-78 |
| 1999 |
| 5 |  | Abhijit Jas,
Kartik Mohanram,
Nur A. Touba:
An Embedded Core DFT Scheme to Obtain Highly Compressed Test Sets.
Asian Test Symposium 1999: 275- |
| 4 |  | Abhijit Jas,
Nur A. Touba:
Using an Embedded Processor for Efficient Deterministic Testing of Systems-on-a-Chip.
ICCD 1999: 418- |
| 3 |  | W. Quddus,
Abhijit Jas,
Nur A. Touba:
Configuration self-test in FPGA-based reconfigurable systems.
ISCAS (1) 1999: 97-100 |
| 2 |  | Abhijit Jas,
Jayabrata Ghosh-Dastidar,
Nur A. Touba:
Scan Vector Compression/Decompression Using Statistical Coding.
VTS 1999: 114-120 |
| 1998 |
| 1 |  | Abhijit Jas,
Nur A. Touba:
Test vector decompression via cyclical scan chains and its application to testing core-based designs.
ITC 1998: 458-464 |