M. P. M. Jank

	2001
1		M. P. M. Jank, Martin Lemberger, Anton J. Bauer, Lothar Frey, Heiner Ryssel: Electrical reliability aspects of through the gate implanted MOS structures with thin oxides. Microelectronics Reliability 41(7): 987-990 (2001)

Coauthor Index

1	Anton J. Bauer	[1]
2	Lothar Frey	[1]
3	Martin Lemberger	[1]
4	Heiner Ryssel	[1]

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