Jakub Janicki

	2011
3		Elham K. Moghaddam, Janusz Rajski, Sudhakar M. Reddy, Jakub Janicki: Low Test Data Volume Low Power At-Speed Delay Tests Using Clock-Gating. Asian Test Symposium 2011: 267-272
2		Jakub Janicki, Jerzy Tyszer, Avijit Dutta, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski: EDT channel bandwidth management in SoC designs with pattern-independent test access mechanism. ITC 2011: 1-9
	2010
1		Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jakub Janicki, Jerzy Tyszer: Dynamic channel allocation for higher EDT compression in SoC designs. ITC 2010: 265-274

Coauthor Index

1	Avijit Dutta	[2]
2	Mark Kassab	[1] [2]
3	Elham K. Moghaddam	[3]
4	Grzegorz Mrugalski	[1] [2]
5	Nilanjan Mukherjee	[1] [2]
6	Janusz Rajski	[1] [2] [3]
7	Sudhakar M. Reddy	[3]
8	Jerzy Tyszer	[1] [2]

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