 | 2008 |
| 4 |  | Shen Hui Wu,
Sridhar Jandhyala,
Yashwant K. Malaiya,
Anura P. Jayasumana:
Antirandom Testing: A Distance-Based Approach.
VLSI Design 2008: (2008) |
| 2000 |
| 3 |  | Sri Jandhyala,
Hari Balachandran,
Manidip Sengupta,
Anura P. Jayasumana:
Clustering Based Evaluation of IDDQ Measurements: Applications in Testing and Classification of ICs.
VTS 2000: 444-452 |
| 1999 |
| 2 |  | Hari Balachandran,
Jason Parker,
Gordon Gammie,
John W. Olson,
Craig Force,
Kenneth M. Butler,
Sri Jandhyala:
Expediting ramp-to-volume production.
ITC 1999: 103-112 |
| 1 |  | Sri Jandhyala,
Hari Balachandran,
Anura P. Jayasumana:
Clustering based techniques for I_DDQ testing.
ITC 1999: 730-737 |