Maria Angeles Jalón

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2010

2 Maria Angeles Jalón, Eduardo J. Peralías: ADC Non-Linearity Low-Cost Test Through a Simplified Double-Histogram Method. J. Electronic Testing 26(1): 47-58 (2010)

2008

1 Eduardo J. Peralías, Maria Angeles Jalón, Adoración Rueda: Simple Evaluation of the Nonlinearity Signature of an ADC Using a Spectral Approach. VLSI Design 2008: (2008)

	2010
2		Maria Angeles Jalón, Eduardo J. Peralías: ADC Non-Linearity Low-Cost Test Through a Simplified Double-Histogram Method. J. Electronic Testing 26(1): 47-58 (2010)
	2008
1		Eduardo J. Peralías, Maria Angeles Jalón, Adoración Rueda: Simple Evaluation of the Nonlinearity Signature of an ADC Using a Spectral Approach. VLSI Design 2008: (2008)

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