Lavanya Jagan

	2010
2		Lavanya Jagan, Camelia Hora, Bram Kruseman, Stefan Eichenberger, Ananta K. Majhi, V. Kamakoti: Impact of Temperature on Test Quality. VLSI Design 2010: 276-281
	2009
1		Lavanya Jagan, Ratan Deep Singh, V. Kamakoti, Ananta K. Majhi: Efficient Grouping of Fail Chips for Volume Yield Diagnostics. VLSI Design 2009: 97-102

Coauthor Index

1	Stefan Eichenberger	[2]
2	Camelia Hora	[2]
3	V. Kamakoti	[1] [2]
4	Bram Kruseman	[2]
5	Ananta K. Majhi	[1] [2]
6	Ratan Deep Singh	[1]

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