Neil G. Jacobson

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2008

2 Kenneth P. Parker, Neil G. Jacobson: Boundary-Scan Testing of Power/Ground Pins. ITC 2008: 1-8

2000

1 Neil G. Jacobson: Streamlining programmable device and system test using IEEE Std 1532. ITC 2000: 847-853

	2008
2		Kenneth P. Parker, Neil G. Jacobson: Boundary-Scan Testing of Power/Ground Pins. ITC 2008: 1-8
	2000
1		Neil G. Jacobson: Streamlining programmable device and system test using IEEE Std 1532. ITC 2000: 847-853

Coauthor Index

1 Kenneth P. Parker [2]

Last update Fri Jun 1 15:44:53 2012 CET by the DBLP Team —

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