Chris Jacobsen

	2005
2		Chris Jacobsen, Tony Saye, Tom Trader: Safely backdriving low voltage devices at in-circuit test. ITC 2005: 7
	2002
1		Tobias Beetz, Michael Feser, Chris Jacobsen, Janos Kirz, David Sayre, David Shapiro, Yefim Sheynkin, Aaron Stein, Sue Wirick: Soft X-ray microscopy at the NSLS. ISBI 2002: 137-140

Coauthor Index

1	Tobias Beetz	[1]
2	Michael Feser	[1]
3	Janos Kirz	[1]
4	Tony Saye	[2]
5	David Sayre	[1]
6	David Shapiro	[1]
7	Yefim Sheynkin	[1]
8	Aaron Stein	[1]
9	Tom Trader	[2]
10	Sue Wirick	[1]

Colors in the list of coauthors

Last update Fri Jun 1 15:44:53 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page