Y. Iyama

	1991
1		J. Miyamoto, N. Ohtsuka, K. Imamiya, N. Tomita, Y. Iyama: Multi-Step Stress Test for Yield Improvement of 16Mbit EPROMs with Redundancy Scheme. ITC 1991: 540-547

Coauthor Index

1	K. Imamiya	[1]
2	J. Miyamoto	[1]
3	N. Ohtsuka	[1]
4	N. Tomita	[1]

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