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Hiroshi Iwai Coauthor index pubzone.org

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DBLP keys2012
21Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLC. Dou, Kuniyuki Kakushima, Parhat Ahmet, Kazuo Tsutsui, A. Nishiyama, Nobuyuki Sugii, Kenji Natori, Takeo Hattori, Hiroshi Iwai: Resistive switching behavior of a CeO2 based ReRAM cell incorporated with Si buffer layer. Microelectronics Reliability 52(4): 688-691 (2012)
2011
20Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLD. Zade, Soshi Sato, Kuniyuki Kakushima, A. Srivastava, Parhat Ahmet, Kazuo Tsutsui, A. Nishiyama, Nobuyuki Sugii, Kenji Natori, Takeo Hattori, Chandan Kumar Sarkar, Hiroshi Iwai: Effects of La2O3 incorporation in HfO2 gated nMOSFETs on low-frequency noise. Microelectronics Reliability 51(4): 746-750 (2011)
19Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSoshi Sato, Kuniyuki Kakushima, Parhat Ahmet, Kenji Ohmori, Kenji Natori, Keisaku Yamada, Hiroshi Iwai: Structural advantages of rectangular-like channel cross-section on electrical characteristics of silicon nanowire field-effect transistors. Microelectronics Reliability 51(5): 879-884 (2011)
18Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLKiichi Tachi, Sylvain Barraud, Kuniyuki Kakushima, Hiroshi Iwai, Sorin Cristoloveanu, Thomas Ernst: Comparison of low-temperature electrical characteristics of gate-all-around nanowire FETs, Fin FETs and fully-depleted SOI FETs. Microelectronics Reliability 51(5): 885-888 (2011)
17Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHiroshi Iwai, Kenji Natori, Kenji Shiraishi, Jun-ichi Iwata, Atsushi Oshiyama, Keisaku Yamada, Kenji Ohmori, Kuniyuki Kakushima, Parhat Ahmet: Si nanowire FET and its modeling. SCIENCE CHINA Information Sciences 54(5): 1004-1011 (2011)
2010
16Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLGia Khanh Tran, Nguyen Dung Dao, Kei Sakaguchi, Kiyomichi Araki, Hiroshi Iwai, Tsutomu Sakata, Koichi Ogawa: Performance Analysis of MIMO Schemes in Residential Home Environment via Wideband MIMO Propagation Measurement. IEICE Transactions 93-A(4): 814-829 (2010)
15Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHiroshi Iwai, Kei Sakaguchi, Tsutomu Sakata, Atsushi Yamamoto: Performance Evaluation of Spatial Correlation Characteristics for Handset Antennas Using Spatial Fading Emulator Based on Clarke's Model. IEICE Transactions 93-B(10): 2514-2522 (2010)
14Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHiroshi Shimomura, Kuniyuki Kakushima, Hiroshi Iwai: Equivalent Noise Temperature Representation for Scaled MOSFETs. IEICE Transactions 93-C(10): 1550-1552 (2010)
13Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHiroshi Shimomura, Kuniyuki Kakushima, Hiroshi Iwai: Effect of High Frequency Noise Current Sources on Noise Figure for Sub-50 nm Node MOSFETs. IEICE Transactions 93-C(5): 678-684 (2010)
12Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLYusuke Kobayashi, Kuniyuki Kakushima, Parhat Ahmet, V. Ramgopal Rao, Kazuo Tsutsui, Hiroshi Iwai: Analysis of dependence of short-channel effects in double-gate MOSFETs on channel thickness. Microelectronics Reliability 50(3): 332-337 (2010)
11Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLKuniyuki Kakushima, K. Okamoto, T. Koyanagi, M. Kouda, Kiichi Tachi, T. Kawanago, J. Song, Parhat Ahmet, Hiroshi Nohira, Kazuo Tsutsui, Nobuyuki Sugii, Takeo Hattori, Hiroshi Iwai: SrO capping effect for La2O3/Ce-silicate gate dielectrics. Microelectronics Reliability 50(3): 356-359 (2010)
10Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLKuniyuki Kakushima, Kiichi Tachi, Parhat Ahmet, Kazuo Tsutsui, Nobuyuki Sugii, Takeo Hattori, Hiroshi Iwai: Advantage of further scaling in gate dielectrics below 0.5 nm of equivalent oxide thickness with La2O3 gate dielectrics. Microelectronics Reliability 50(6): 790-793 (2010)
2009
9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSik-Lam Siu, Hei Wong, Wing-Shan Tam, Kuniyuki Kakushima, Hiroshi Iwai: Subthreshold parameters of radio-frequency multi-finger nanometer MOS transistors. Microelectronics Reliability 49(4): 387-391 (2009)
2008
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLParhat Ahmet, Kentaro Nakagawa, Kuniyuki Kakushima, Hiroshi Nohira, Kazuo Tsutsui, Nobuyuki Sugii, Takeo Hattori, Hiroshi Iwai: Electrical characteristics of MOSFETs with La2O3/Y2O3 gate stack. Microelectronics Reliability 48(11-12): 1769-1771 (2008)
2007
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHiroshi Iwai, Tsutomu Sakata, Atsushi Yamamoto, Kei Sakaguchi: 3-D Angular Spectrum Measurements at 5 GHz in a Residential Two-Story House. IEICE Transactions 90-B(9): 2344-2351 (2007)
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLYusuke Kobayashi, C. Raghunathan Manoj, Kazuo Tsutsui, Venkanarayan Hariharan, Kuniyuki Kakushima, V. Ramgopal Rao, Parhat Ahmet, Hiroshi Iwai: Parasitic Effects in Multi-Gate MOSFETs. IEICE Transactions 90-C(10): 2051-2056 (2007)
2006
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLGia Khanh Tran, Nguyen Dung Dao, Kei Sakaguchi, Kiyomichi Araki, Hiroshi Iwai, Tsutomu Sakata, Koichi Ogawa: Performance Analysis of MIMO-OFDM Systems using Indoor Wideband MIMO Channel Measurement Data. VTC Spring 2006: 2868-2872
2005
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLYongshik Kim, Kunihiro Miyauchi, Shun'ichiro Ohmi, Kazuo Tsutsui, Hiroshi Iwai: Electrical properties of vacuum annealed La2O3 thin films grown by E-beam evaporation. Microelectronics Journal 36(1): 41-49 (2005)
2004
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHiroshi Iwai: CMOS Scaling for sub-90 nm to sub-10 nm. VLSI Design 2004: 30-
2002
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHiroshi Iwai, Shun'ichiro Ohmi: Silicon integrated circuit technology from past to future. Microelectronics Reliability 42(4-5): 465-491 (2002)
1987
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHiroshi Iwai, Mark R. Pinto, Conor S. Rafferty, J. E. Oristian, Robert W. Dutton: Analysis of Velocity Saturation and Other Effects on Short-Channel MOS Transistor Capacitances. IEEE Trans. on CAD of Integrated Circuits and Systems 6(2): 173-184 (1987)

Coauthor Index

1Parhat Ahmet [6] [8] [10] [11] [12] [17] [19] [20] [21]
2Kiyomichi Araki [5] [16]
3Sylvain Barraud [18]
4Sorin Cristoloveanu [18]
5Nguyen Dung Dao [5] [16]
6C. Dou [21]
7Robert W. Dutton [1]
8Thomas Ernst [18]
9Venkanarayan Hariharan [6]
10Takeo Hattori [8] [10] [11] [20] [21]
11Jun-ichi Iwata [17]
12Kuniyuki Kakushima [6] [8] [9] [10] [11] [12] [13] [14] [17] [18] [19] [20] [21]
13T. Kawanago [11]
14Yongshik Kim [4]
15Yusuke Kobayashi [6] [12]
16M. Kouda [11]
17T. Koyanagi [11]
18C. Raghunathan Manoj [6]
19Kunihiro Miyauchi [4]
20Kentaro Nakagawa [8]
21Kenji Natori [17] [19] [20] [21]
22A. Nishiyama [20] [21]
23Hiroshi Nohira [8] [11]
24Koichi Ogawa [5] [16]
25Shun'ichiro Ohmi [2] [4]
26Kenji Ohmori [17] [19]
27K. Okamoto [11]
28J. E. Oristian [1]
29Atsushi Oshiyama [17]
30Mark R. Pinto [1]
31Conor S. Rafferty [1]
32V. Ramgopal Rao [6] [12]
33Kei Sakaguchi [5] [7] [15] [16]
34Tsutomu Sakata [5] [7] [15] [16]
35Chandan Kumar Sarkar [20]
36Soshi Sato [19] [20]
37Hiroshi Shimomura [13] [14]
38Kenji Shiraishi [17]
39Sik-Lam Siu [9]
40J. Song [11]
41A. Srivastava [20]
42Nobuyuki Sugii [8] [10] [11] [20] [21]
43Kiichi Tachi [10] [11] [18]
44Wing-Shan Tam [9]
45Gia Khanh Tran [5] [16]
46Kazuo Tsutsui [4] [6] [8] [10] [11] [12] [20] [21]
47Hei Wong [9]
48Keisaku Yamada [17] [19]
49Atsushi Yamamoto [7] [15]
50D. Zade [20]

Colors in the list of coauthors

Last update Fri Jun 1 15:44:53 2012 CET by the DBLP TeamThis material is Open Data Data released under the ODC-BY 1.0 license — See also our legal information page