H. Iwai

List of publications from the DBLP Bibliography Server - FAQ

Ask others: ACM DL/Guide -

2005

2 E. Miranda, J. Molina, Y. Kim, H. Iwai: Degradation of high-K LA₂O₃ gate dielectrics using progressive electrical stress. Microelectronics Reliability 45(9-11): 1365-1369 (2005)

2002

1 H. Iwai, S. Ohmi: Trend of CMOS downsizing and its reliability. Microelectronics Reliability 42(9-11): 1251-1258 (2002)

	2005
2		E. Miranda, J. Molina, Y. Kim, H. Iwai: Degradation of high-K LA₂O₃ gate dielectrics using progressive electrical stress. Microelectronics Reliability 45(9-11): 1365-1369 (2005)
	2002
1		H. Iwai, S. Ohmi: Trend of CMOS downsizing and its reliability. Microelectronics Reliability 42(9-11): 1251-1258 (2002)

Coauthor Index

Last update Fri Jun 1 15:44:53 2012 CET by the DBLP Team —

Data released under the ODC-BY 1.0 license — See also our legal information page