André Ivanov

	2012
107		Dipanjan Sengupta, Flavio M. de Paula, Alan J. Hu, Andreas G. Veneris, André Ivanov: Lazy suspect-set computation: fault diagnosis for deep electrical bugs. ACM Great Lakes Symposium on VLSI 2012: 189-194
	2011
106		Mehdi Karimibiuki, Kyle Balston, Alan J. Hu, André Ivanov: Post-silicon code coverage evaluation with reduced area overhead for functional verification of SoC. HLDVT 2011: 92-97
105		Renato P. Ribas, Yuyang Sun, André Inácio Reis, André Ivanov: Self-checking test circuits for latches and flip-flops. IOLTS 2011: 210-213
	2009
104		Erno Salminen, Cristian Grecu, Timo D. Hämäläinen, André Ivanov: Application modelling and hardware description for network-on-chip benchmarking. IET Computers & Digital Techniques 3(5): 539-550 (2009)
103		Faizal Karim, Marco Ottavi, Hamidreza Hashempour, Vamsi Vankamamidi, Konrad Walus, André Ivanov, Fabrizio Lombardi: Modeling and Evaluating Errors Due to Random Clock Shifts in Quantum-Dot Cellular Automata Circuits. J. Electronic Testing 25(1): 55-66 (2009)
	2008
102		Partha Pratim Pande, Amlan Ganguly, Benjamin Belzer, Alireza Nojeh, André Ivanov: Novel interconnect infrastructures for massive multicore chips - an overview. ISCAS 2008: 2777-2780
101		Rod Blaine Foist, Cristian Grecu, André Ivanov, Robin Turner: An FPGA Design Project: Creating a PowerPC Subsystem Plus User Logic. IEEE Trans. Education 51(3): 312-318 (2008)
	2007
100		Marco Ottavi, Hamid Hashempour, Vamsi Vankamamidi, Faizal Karim, Konrad Walus, André Ivanov: On the Error Effects of Random Clock Shifts in Quantum-Dot Cellular Automata Circuits. DFT 2007: 487-495
99		Cristian Grecu, Lorena Anghel, Partha Pratim Pande, André Ivanov, Resve Saleh: Essential Fault-Tolerance Metrics for NoC Infrastructures. IOLTS 2007: 37-42
98		Cristian Grecu, André Ivanov, Partha Pratim Pande, Axel Jantsch, Erno Salminen, Ümit Y. Ogras, Radu Marculescu: Towards Open Network-on-Chip Benchmarks. NOCS 2007: 205
97		Baosheng Wang, Yuejian Wu, André Ivanov: A Fast Diagnosis Scheme for Distributed Small Embedded SRAMs CoRR abs/0710.4655: (2007)
96		Cristian Grecu, André Ivanov, Resve A. Saleh, Partha Pratim Pande: Testing Network-on-Chip Communication Fabrics. IEEE Trans. on CAD of Integrated Circuits and Systems 26(12): 2201-2214 (2007)
95		Qiang Xu, Baosheng Wang, André Ivanov, Fung Yu Young: Test scheduling for built-in self-tested embedded SRAMs with data retention faults. IET Computers & Digital Techniques 1(3): 256-264 (2007)
94		Zahra Sadat Ebadi, Alireza Nasiri Avanaki, Resve Saleh, André Ivanov: Design and implementation of reconfigurable and flexible test access mechanism for system-on-chip. Integration 40(2): 149-160 (2007)
	2006
93		Yuejian Wu, André Ivanov: Low Power SoC Memory BIST. DFT 2006: 197-205
92		Cristian Grecu, André Ivanov, Res Saleh, Partha Pratim Pande: NoC Interconnect Yield Improvement Using Crosspoint Redundancy. DFT 2006: 457-465
91		Cristian Grecu, André Ivanov, Res Saleh, Egor S. Sogomonyan, Partha Pratim Pande: On-line Fault Detection and Location for NoC Interconnects. IOLTS 2006: 145-150
90		Cristian Grecu, Partha Pratim Pande, André Ivanov, Res Saleh: BIST for Network-on-Chip Interconnect Infrastructures. VTS 2006: 30-35
89		André Ivanov: Session Abstract. VTS 2006: 424-425
88		Josh Yang, Baosheng Wang, Yuejian Wu, André Ivanov: Fast detection of data retention faults and other SRAM cell open defects. IEEE Trans. on CAD of Integrated Circuits and Systems 25(1): 167-180 (2006)
	2005
87		Baosheng Wang, Josh Yang, Yuejian Wu, André Ivanov: A retention-aware test power model for embedded SRAM. ASP-DAC 2005: 1180-1183
86		Baosheng Wang, Yuejian Wu, André Ivanov: A Fast Diagnosis Scheme for Distributed Small Embedded SRAMs. DATE 2005: 852-857
85		Cristian Grecu, Partha Pratim Pande, Baosheng Wang, André Ivanov, Res Saleh: Methodologies and Algorithms for Testing Switch-Based NoC Interconnects. DFT 2005: 238-246
84		Partha Pratim Pande, Cristian Grecu, Michael Jones, André Ivanov, Res Saleh: Effect of traffic localization on energy dissipation in NoC-based interconnect. ISCAS (2) 2005: 1774-1777
83		Samad Sheikhaei, Shahriar Mirabbasi, André Ivanov: A 0.35µm CMOS comparator circuit for high-speed ADC applications. ISCAS (6) 2005: 6134-6137
82		Samad Sheikhaei, Shahriar Mirabbasi, André Ivanov: A 4-bit 5 GS/s flash A/D converter in 0.18µm CMOS. ISCAS (6) 2005: 6138-6141
81		Touraj Farahmand, Sassan Tabatabaei, Freddy Ben-Zeev, André Ivanov: A DDJ calibration methodology for high-speed test and measurement equipments. ITC 2005: 10
80		Baosheng Wang, Yuejian Wu, Josh Yang, André Ivanov, Yervant Zorian: SRAM Retention Testing: Zero Incremental Time Integration with March Algorithms. VTS 2005: 66-71
79		André Ivanov, Giovanni De Micheli: Guest Editors' Introduction: The Network-on-Chip Paradigm in Practice and Research. IEEE Design & Test of Computers 22(5): 399-403 (2005)
78		Partha Pratim Pande, Cristian Grecu, André Ivanov, Resve A. Saleh, Giovanni De Micheli: Design, Synthesis, and Test of Networks on Chips. IEEE Design & Test of Computers 22(5): 404-413 (2005)
77		Andy Kuo, Roberto Rosales, Touraj Farahmand, Sassan Tabatabaei, André Ivanov: Crosstalk bounded uncorrelated jitter (BUJ) for high-speed interconnects. IEEE T. Instrumentation and Measurement 54(5): 1800-1810 (2005)
76		Partha Pratim Pande, Cristian Grecu, Michael Jones, André Ivanov, Resve A. Saleh: Performance Evaluation and Design Trade-Offs for Network-on-Chip Interconnect Architectures. IEEE Trans. Computers 54(8): 1025-1040 (2005)
75		Yvan Maidon, Thomas Zimmer, André Ivanov: An Analog Circuit Fault Characterization Methodology. J. Electronic Testing 21(2): 127-134 (2005)
74		Baosheng Wang, Andy Kuo, Touraj Farahmand, André Ivanov, Yong B. Cho, Sassan Tabatabaei: A Realistic Timing Test Model and Its Applications in High-Speed Interconnect Devices. J. Electronic Testing 21(6): 621-630 (2005)
73		Cristian Grecu, Partha Pratim Pande, André Ivanov, Res Saleh: Timing analysis of network on chip architectures for MP-SoC platforms. Microelectronics Journal 36(9): 833-845 (2005)
	2004
72		Cristian Grecu, Partha Pratim Pande, André Ivanov, Res Saleh: Structured interconnect architecture: a solution for the non-scalability of bus-based SoCs. ACM Great Lakes Symposium on VLSI 2004: 192-195
71		Baosheng Wang, Yuejian Wu, André Ivanov: Designs for Reducing Test Time of Distributed Small Embedded SRAMs. DFT 2004: 120-128
70		Cristian Grecu, Partha Pratim Pande, André Ivanov, Res Saleh: A Scalable Communication-Centric SoC Interconnect Architecture. ISQED 2004: 343-348
69		Andy Kuo, Touraj Farahmand, Nelson Ou, André Ivanov, Sassan Tabatabaei: Jitter Models and Measurement Methods for High-Speed Serial Interconnects. ITC 2004: 1295-1302
68		Josh Yang, Baosheng Wang, André Ivanov: Open Defects Detection within 6T SRAM Cells using a No Write Recovery Test Mode. VLSI Design 2004: 493-498
67		Josep Altet, Antonio Rubio, M. Amine Salhi, J. L. Gálvez, Stefan Dilhaire, Ashish Syal, André Ivanov: Sensing temperature in CMOS circuits for Thermal Testing. VTS 2004: 179-184
66		Baosheng Wang, Josh Yang, James Cicalo, André Ivanov, Yervant Zorian: Reducing Embedded SRAM Test Time under Redundancy Constraints. VTS 2004: 237-242
65		André Ivanov, Fabrizio Lombardi, Cecilia Metra: Guest Editors' Introduction: Advances in VLSI Testing at MultiGbps Rates. IEEE Design & Test of Computers 21(4): 274-276 (2004)
64		Nelson Ou, Touraj Farahmand, Andy Kuo, Sassan Tabatabaei, André Ivanov: Jitter Models for the Design and Test of Gbps-Speed Serial Interconnects. IEEE Design & Test of Computers 21(4): 302-313 (2004)
63		Mohsen Nahvi, André Ivanov: Indirect test architecture for SoC testing. IEEE Trans. on CAD of Integrated Circuits and Systems 23(7): 1128-1142 (2004)
	2003
62		Baosheng Wang, Yong B. Cho, Sassan Tabatabaei, André Ivanov: Yield, Overall Test Environment Timing Accuracy, and Defect Level Trade-Offs for High-Speed Interconnect Device Testing. Asian Test Symposium 2003: 348-353
61		Zahra Sadat Ebadi, André Ivanov: Time Domain Multiplexed TAM: Implementation and Comparison. DATE 2003: 10732-10737
60		Mama Hamour, Resve A. Saleh, Shahriar Mirabbasi, André Ivanov: Analog IP design flow for SoC applications. ISCAS (4) 2003: 676-679
59		Partha Pratim Pande, Cristian Grecu, André Ivanov, Res Saleh: Design of a switch for network on chip applications. ISCAS (5) 2003: 217-220
58		Partha Pratim Pande, Cristian Grecu, André Ivanov: High-Throughput Switch-Based Interconnect for Future SoCs. IWSOC 2003: 304-310
57		Baosheng Wang, Josh Yang, André Ivanov: Reducing Test Time of Embedded SRAMs. MTDT 2003: 47-52
56		Mohsen Nahvi, André Ivanov: An Embedded Autonomous Scan-Based Results Analyzer (EARA) for SoC Cores. VTS 2003: 293-298
55		Florence Azaïs, Yves Bertrand, Michel Renovell, André Ivanov, Sassan Tabatabaei: An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs. IEEE Design & Test of Computers 20(1): 60-67 (2003)
54		André Ivanov: Test Technology Technical Council Newsletter. J. Electronic Testing 19(1): 7-8 (2003)
53		André Ivanov: Guest Editorial. J. Electronic Testing 19(2): 101-102 (2003)
52		André Ivanov: Test Technology Technical Council Newsletter. J. Electronic Testing 19(2): 99-100 (2003)
51		André Ivanov: Test Technology Technical Council Newsletter. J. Electronic Testing 19(3): 221-222 (2003)
50		Josep Altet, André Ivanov, A. Wong: Thermal Testing of Analogue Integrated Circuits: A Case Study. J. Electronic Testing 19(3): 353-357 (2003)
49		André Ivanov: Test Technology Technical Council Newsletter. J. Electronic Testing 19(4): 365-366 (2003)
48		André Ivanov: Test Technology Technical Council Newsletter. J. Electronic Testing 19(5): 497-498 (2003)
	2002
47		Bartomeu Alorda, André Ivanov, Jaume Segura: An Off-Chip Sensor Circuit for On-Line Transient Current Testing. IOLTW 2002: 192
46		Mohsen Nahvi, André Ivanov, Resve A. Saleh: Dedicated Autonomous Scan-Based Testing (DAST) for Embedded Cores. ITC 2002: 1176-1184
45		Sassan Tabatabaei, André Ivanov: An Embedded Core for Sub-Picosecond Timing Measurements. ITC 2002: 129-137
44		Sassan Tabatabaei, André Ivanov: Embedded Timing Analysis: A SoC Infrastructure. IEEE Design & Test of Computers 19(3): 24-36 (2002)
43		André Ivanov: Test Technology Technical Council Newsletter. J. Electronic Testing 18(2): 105-106 (2002)
42		André Ivanov: Test Technology Technical Council Newsletter. J. Electronic Testing 18(3): 257-258 (2002)
41		Ashish Syal, Victor Lee, André Ivanov, Josep Altet: CMOS Differential and Absolute Thermal Sensors. J. Electronic Testing 18(3): 295-304 (2002)
40		André Ivanov: Test Technology Technical Council Newsletter. J. Electronic Testing 18(4-5): 361-362 (2002)
	2001
39		Zahra Sadat Ebadi, André Ivanov: Design of an Optimal Test Access Architecture Using a Genetic Algorithm. Asian Test Symposium 2001: 205-
38		Ashish Syal, Victor Lee, André Ivanov, Josep Altet: CMOS Differential and Absolute Thermal Sensors. IOLTW 2001: 127-
37		André Ivanov, Sumbal Rafiq, Michel Renovell, Florence Azaïs, Yves Bertrand: On the detectability of CMOS floating gate transistor faults. IEEE Trans. on CAD of Integrated Circuits and Systems 20(1): 116-128 (2001)
36		André Ivanov: Test Technology Newsletter. J. Electronic Testing 17(5): 369-370 (2001)
	2000
35		Bapiraju Vinnakota, André Ivanov: Biomedical ICs: What is Different about Testing those ICs? VTS 2000: 329-332
34		Fidel Muradali, André Ivanov: Do I Need this Tool for My Chips to Work? VTS 2000: 471-472
33		André Ivanov, Vikram Devdas: Catastrophic Short and Open Fault Detection in Bipolar CML Circuits: A Case Study. J. Electronic Testing 16(6): 631-634 (2000)
	1999
32		Sassan Tabatabaei, André Ivanov: A built-in current monitor for testing analog circuit blocks. ISCAS (2) 1999: 109-114
31		Michel Renovell, André Ivanov, Yves Bertrand, Florence Azaïs, Sumbal Rafiq: Optimal conditions for Boolean and current detection of floating gate faults. ITC 1999: 477-486
30		Sassan Tabatabaei, André Ivanov: A Current Integrator for BIST of Mixed-Signal ICs. VTS 1999: 311-318
	1998
29		Vikram Devdas, André Ivanov: Non-Intrusive Testing of High-Speed CML Circuits. Asian Test Symposium 1998: 172-178
28		Sumbal Rafiq, André Ivanov, Sassan Tabatabaei, Michel Renovell: Testing for Floating Gates Defects in CMOS Circuits. Asian Test Symposium 1998: 228-236
27		Florence Azaïs, André Ivanov, Michel Renovell, Yves Bertrand: A Methodology and Design for Effective Testing of Voltage-Controlled Oscillators (VCOs. Asian Test Symposium 1998: 383-387
	1997
26		Maneesha Dalmia, André Ivanov, Sassan Tabatabaei: Power supply current monitoring techniques for testing PLLs. Asian Test Symposium 1997: 366-371
	1996
25		Yervant Zorian, Tom Anderson, Yvon Savaria, Claude Thibeault, André Ivanov: Panel Summaries. IEEE Design & Test of Computers 13(3): 6, 110-112 (1996)
24		André Ivanov, Barry K. Tsuji, Yervant Zorian: Programmable BIST Space Compactors. IEEE Trans. Computers 45(12): 1393-1404 (1996)
	1995
23		Andrew Bishop, André Ivanov: Fault Simulation of an OTA Biquadratic Filter. ISCAS 1995: 1764-1767
22		Yuejian Wu, André Ivanov: Reducing Hardware with Fuzzy Multiple Signature Analysis. IEEE Design & Test of Computers 12(1): 68-74 (1995)
21		Yuejian Wu, André Ivanov: Single-Reference Multiple Intermediate Signature (SREMIS) Analysis for BIST. IEEE Trans. Computers 44(6): 817-825 (1995)
20		D. Lambidonis, André Ivanov, Vinod K. Agarwal: Fast signature computation for BIST linear compactors. IEEE Trans. on CAD of Integrated Circuits and Systems 14(8): 1037-1044 (1995)
19		D. Lambidonis, Vinod K. Agarwal, André Ivanov, Dhiren Xavier: A quasi-optimal scheduling of intermediate signatures for multiple signature analysis compaction testing schemes. J. Electronic Testing 6(1): 75-84 (1995)
	1994
18		A. J. Bishop, André Ivanov: On the Testability of CMOS Feedback Amplifiers. DFT 1994: 65-73
17		Slawomir Pilarski, André Ivanov, Tiko Kameda: On minimizing aliasing in scan-based compaction. J. Electronic Testing 5(1): 83-90 (1994)
	1993
16		Yervant Zorian, André Ivanov: Programmable Space Compaction for BIST. FTCS 1993: 340-349
15		Tiko Kameda, Slawomir Pilarski, André Ivanov: Notes on Multiple Input Signature Analysis. IEEE Trans. Computers 42(2): 228-234 (1993)
14		Slawomir Pilarski, Tiko Kameda, André Ivanov: Sequential faults and aliasing. IEEE Trans. on CAD of Integrated Circuits and Systems 12(7): 1068-1074 (1993)
	1992
13		Yervant Zorian, André Ivanov: An Effective BIST Scheme for ROM's. IEEE Trans. Computers 41(5): 646-653 (1992)
12		Dhiren Xavier, Robert C. Aitken, André Ivanov, Vinod K. Agarwal: Using an asymmetric error model to study aliasing in signature analysis registers. IEEE Trans. on CAD of Integrated Circuits and Systems 11(1): 16-25 (1992)
11		André Ivanov, Yervant Zorian: Count-based BIST compaction schemes and aliasing probability computation. IEEE Trans. on CAD of Integrated Circuits and Systems 11(6): 768-777 (1992)
	1991
10		D. Lambidonis, André Ivanov, Vinod K. Agarwal: Fast Signature Computation for Linear Compactors. ITC 1991: 808-817
9		André Ivanov, Corot W. Starke, Vinod K. Agarwal, Wilfried Daehn, Matthias Gruetzner, Tom W. Williams: Iterative algorithms for computing aliasing probabilities. IEEE Trans. on CAD of Integrated Circuits and Systems 10(2): 260-265 (1991)
	1990
8		André Ivanov, Yervant Zorian: Computing the Error Escape Probability in Count-Based Compaction Schemes. ICCAD 1990: 368-371
7		Yervant Zorian, André Ivanov: EEODM: An effective BIST scheme for ROMs. ITC 1990: 871-879
	1989
6		Dhiren Xavier, Robert C. Aitken, André Ivanov, Vinod K. Agarwal: : Experiments on Aliasing in Signature Analysis Registers. ITC 1989: 344-354
5		André Ivanov, Vinod K. Agarwal: An analysis of the probabilistic behavior of linear feedback signature registers. IEEE Trans. on CAD of Integrated Circuits and Systems 8(10): 1074-1088 (1989)
	1988
4		André Ivanov, Vinod K. Agarwal: An iterative technique for calculating aliasing probability of linear feedback signature registers. FTCS 1988: 70-75
3		Henry Cox, André Ivanov, Vinod K. Agarwal, Janusz Rajski: On Multiple Fault Coverage and Aliasing Probability Measures. ITC 1988: 314-321
2		André Ivanov, Vinod K. Agarwal: Dynamic testability measures for ATPG. IEEE Trans. on CAD of Integrated Circuits and Systems 7(5): 598-608 (1988)
	1986
1		André Ivanov, Vinod K. Agarwal: Testability Measures : What Do They Do for ATPG ? ITC 1986: 129-139

Coauthor Index

1	Vinod K. Agarwal	[1] [2] [3] [4] [5] [6] [9] [10] [12] [19] [20]
2	Robert C. Aitken (Rob Aitken)	[6] [12]
3	Bartomeu Alorda	[47]
4	Josep Altet	[38] [41] [50] [67]
5	Tom Anderson	[25]
6	Lorena Anghel	[99]
7	Alireza Nasiri Avanaki	[94]
8	Florence Azaïs	[27] [31] [37] [55]
9	Kyle Balston	[106]
10	Benjamin Belzer	[102]
11	Freddy Ben-Zeev	[81]
12	Yves Bertrand	[27] [31] [37] [55]
13	A. J. Bishop	[18]
14	Andrew Bishop	[23]
15	Yong B. Cho	[62] [74]
16	James Cicalo	[66]
17	Henry Cox	[3]
18	Wilfried Daehn	[9]
19	Maneesha Dalmia	[26]
20	Vikram Devdas	[29] [33]
21	Stefan Dilhaire	[67]
22	Zahra Sadat Ebadi	[39] [61] [94]
23	Touraj Farahmand	[64] [69] [74] [77] [81]
24	Rod Blaine Foist	[101]
25	J. L. Gálvez	[67]
26	Amlan Ganguly	[102]
27	Cristian Grecu	[58] [59] [70] [72] [73] [76] [78] [84] [85] [90] [91] [92] [96] [98] [99] [101] [104]
28	Matthias Gruetzner	[9]
29	Timo Hämäläinen (Timo D. Hämäläinen)	[104]
30	Mama Hamour	[60]
31	Hamid Hashempour	[100]
32	Hamidreza Hashempour	[103]
33	Alan J. Hu	[106] [107]
34	Axel Jantsch	[98]
35	Michael Jones	[76] [84]
36	Tiko Kameda	[14] [15] [17]
37	Faizal Karim	[100] [103]
38	Mehdi Karimibiuki	[106]
39	Andy Kuo	[64] [69] [74] [77]
40	D. Lambidonis	[10] [19] [20]
41	Victor Lee	[38] [41]
42	Fabrizio Lombardi	[65] [103]
43	Yvan Maidon	[75]
44	Radu Marculescu	[98]
45	Cecilia Metra	[65]
46	Giovanni De Micheli	[78] [79]
47	Shahriar Mirabbasi	[60] [82] [83]
48	Fidel Muradali	[34]
49	Mohsen Nahvi	[46] [56] [63]
50	Alireza Nojeh	[102]
51	Ümit Y. Ogras	[98]
52	Marco Ottavi	[100] [103]
53	Nelson Ou	[64] [69]
54	Partha Pratim Pande	[58] [59] [70] [72] [73] [76] [78] [84] [85] [90] [91] [92] [96] [98] [99] [102]
55	Flavio M. de Paula	[107]
56	Slawomir Pilarski	[14] [15] [17]
57	Sumbal Rafiq	[28] [31] [37]
58	Janusz Rajski	[3]
59	André Inácio Reis	[105]
60	Michel Renovell	[27] [28] [31] [37] [55]
61	Renato P. Ribas	[105]
62	Roberto Rosales	[77]
63	Antonio Rubio	[67]
64	Resve A. Saleh (Resve Saleh, Res Saleh)	[46] [59] [60] [70] [72] [73] [76] [78] [84] [85] [90] [91] [92] [94] [96] [99]
65	M. Amine Salhi	[67]
66	Erno Salminen	[98] [104]
67	Yvon Savaria	[25]
68	Jaume Segura	[47]
69	Dipanjan Sengupta	[107]
70	Samad Sheikhaei	[82] [83]
71	Egor S. Sogomonyan	[91]
72	Corot W. Starke	[9]
73	Yuyang Sun	[105]
74	Ashish Syal	[38] [41] [67]
75	Sassan Tabatabaei	[26] [28] [30] [32] [44] [45] [55] [62] [64] [69] [74] [77] [81]
76	Claude Thibeault	[25]
77	Barry K. Tsuji	[24]
78	Robin Turner	[101]
79	Vamsi Vankamamidi	[100] [103]
80	Andreas G. Veneris	[107]
81	Bapiraju Vinnakota	[35]
82	Konrad Walus	[100] [103]
83	Baosheng Wang	[57] [62] [66] [68] [71] [74] [80] [85] [86] [87] [88] [95] [97]
84	Tom W. Williams	[9]
85	A. Wong	[50]
86	Yuejian Wu	[21] [22] [71] [80] [86] [87] [88] [93] [97]
87	Dhiren Xavier	[6] [12] [19]
88	Qiang Xu	[95]
89	Josh Yang	[57] [66] [68] [80] [87] [88]
90	Evangeline F. Y. Young (F. Y. Young, Fung Yu Young)	[95]
91	Thomas Zimmer	[75]
92	Yervant Zorian	[7] [8] [11] [13] [16] [24] [25] [66] [80]

Colors in the list of coauthors

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