 | 2007 |
| 9 |  | Gaetano Iuculano,
Lars Nielsen,
Andrea Zanobini,
Gabriella Pellegrini:
The Principle of Maximum Entropy Applied in the Evaluation of the Measurement Uncertainty.
IEEE T. Instrumentation and Measurement 56(3): 717-722 (2007) |
| 2006 |
| 8 |  | Andrea Zanobini,
Gaetano Iuculano,
Alessandro Falciani:
Automatic-test equipment for the characterization of aluminum electrolytic capacitors.
IEEE T. Instrumentation and Measurement 55(2): 682-688 (2006) |
| 2005 |
| 7 |  | Gaetano Pasini,
Pier Andrea Traverso,
Domenico Mirri,
Gaetano Iuculano,
Fabio Filicori:
Hardware implementation of a broad-band vector spectrum analyzer based on randomized sampling.
IEEE T. Instrumentation and Measurement 54(4): 1575-1582 (2005) |
| 6 |  | Andrea Zanobini,
Gaetano Iuculano,
Aldo Ponterio:
Distance scale calibration of optical time-domain reflectometers with the recirculating delay line method.
IEEE T. Instrumentation and Measurement 54(6): 2554-2556 (2005) |
| 2004 |
| 5 |  | Domenico Mirri,
Fabio Filicori,
Gaetano Iuculano,
Gaetano Pasini:
A nonlinear dynamic model for performance analysis of large-signal amplifiers in communication systems.
IEEE T. Instrumentation and Measurement 53(2): 341-350 (2004) |
| 2003 |
| 4 |  | Domenico Mirri,
Gaetano Pasini,
Pier Andrea Traverso,
Fabio Filicori,
Gaetano Iuculano:
A finite-memory discrete-time convolution approach for the nonlinear dynamic modelling of S/H-ADC devices.
Computer Standards & Interfaces 25(1): 33-44 (2003) |
| 3 |  | Gaetano Iuculano,
Andrea Zanobini,
Annarita Lazzari,
G. P. Gualtieri:
Measurement uncertainty in a multivariate model: a novel approach.
IEEE T. Instrumentation and Measurement 52(5): 1573-1580 (2003) |
| 2001 |
| 2 |  | Gaetano Pasini,
Domenico Mirri,
Gaetano Iuculano,
Fabio Filicori:
Implementation and performance evaluation of a broad-band power spectrum analyzer.
IEEE T. Instrumentation and Measurement 50(4): 1024-1029 (2001) |
| 1 |  | Domenico Mirri,
Gaetano Iuculano,
Annarita Lazzari,
Gaetano Pasini:
Performance function for equally-spaced digital spectrum analysis.
IEEE T. Instrumentation and Measurement 50(5): 1302-1306 (2001) |