 | 2007 |
| 3 |  | Wolfgang Soldner,
Martin Streibl,
U. Hodel,
Marc Tiebout,
Harald Gossner,
Doris Schmitt-Landsiedel,
Jung-Hoon Chun,
Choshu Ito,
Robert W. Dutton:
RF ESD protection strategies: Codesign vs. low-C protection.
Microelectronics Reliability 47(7): 1008-1015 (2007) |
| 2006 |
| 2 |  | Tze Wee Chen,
Choshu Ito,
William Loh,
Robert W. Dutton:
Post-breakdown leakage resistance and its dependence on device area.
Microelectronics Reliability 46(9-11): 1612-1616 (2006) |
| 2001 |
| 1 |  | Choshu Ito,
Kaustav Banerjee,
Robert W. Dutton:
Analysis and Design of ESD Protection Circuits for High-Frequency/RF Applications.
ISQED 2001: 117-122 |