| | |
- CSB - MetaPress - Google - Bing - Yahoo
 | 1999 | |
|---|---|---|
| 2 |      | Hsin-Shu Chen, A. Ito: Characterization of 1/f noise vs. number of gate stripes in MOS transistors. ISCAS (2) 1999: 310-313 |
| 1984 | ||
| 1 |  | Y. Goto, K. Ozaki, T. Ishizuka, A. Ito, Y. Furukawa, T. Inagaki: Electron Beam Prober for LSI Testing with 100ps Time Resolution. ITC 1984: 543-549 |
| 1 | Hsin-Shu Chen | [2] |
| 2 | Y. Furukawa | [1] |
| 3 | Y. Goto | [1] |
| 4 | T. Inagaki | [1] |
| 5 | T. Ishizuka | [1] |
| 6 | K. Ozaki | [1] |
Colors in the list of coauthors
Last update Sat Jun 2 20:57:36 2012 CET by the DBLP Team —
Data released under the ODC-BY 1.0 license — See also our legal information page