Md M. Islam

	2005
1		E. Misra, Md M. Islam, Mahbub Hasan, H. C. Kim, T. L. Alford: Percolative approach for failure time prediction of thin film interconnects under high current stress. Microelectronics Reliability 45(2): 391-395 (2005)

Coauthor Index

1	T. L. Alford	[1]
2	Mahbub Hasan	[1]
3	H. C. Kim	[1]
4	E. Misra	[1]

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