Ahmad E. Islam

	2007
1		Kunhyuk Kang, Keejong Kim, Ahmad E. Islam, Muhammad Ashraful Alam, Kaushik Roy: Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement. DAC 2007: 358-363

Coauthor Index

1	Muhammad Ashraful Alam	[1]
2	Kunhyuk Kang	[1]
3	Keejong Kim	[1]
4	Kaushik Roy	[1]

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