Takashi Ishimura

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2000

1 Koji Nakamae, Takashi Ishimura, Hiromu Fujioka: EB tester fault localization algorithm for combinational circuits by utilizing fault simulation and test pattern sequence for EB tester. Systems and Computers in Japan 31(8): 41-48 (2000)

	2000
1		Koji Nakamae, Takashi Ishimura, Hiromu Fujioka: EB tester fault localization algorithm for combinational circuits by utilizing fault simulation and test pattern sequence for EB tester. Systems and Computers in Japan 31(8): 41-48 (2000)

Coauthor Index

1 Hiromu Fujioka [1]

2 Koji Nakamae [1]

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