Masayasu Ishiko

	2006
3		Masayasu Ishiko, Masanori Usui, Takashi Ohuchi, Mikio Shirai: Design concept for wire-bonding reliability improvement by optimizing position in power devices. Microelectronics Journal 37(3): 262-268 (2006)
	2005
2		Masanori Usui, Masayasu Ishiko, Koji Hotta, Satoshi Kuwano, Masato Hashimoto: Effects of uni-axial mechanical stress on IGBT characteristics. Microelectronics Reliability 45(9-11): 1682-1687 (2005)
	2002
1		Masanori Usui, Takahide Sugiyama, Masayasu Ishiko, Jun Morimoto, Hirokazu Saitoh, Masaki Ajioka: Characterization of Trench MOS Gate Structures Utilizing Photon Emission Microscopy. Microelectronics Reliability 42(9-11): 1647-1652 (2002)

Coauthor Index

1	Masaki Ajioka	[1]
2	Masato Hashimoto	[2]
3	Koji Hotta	[2]
4	Satoshi Kuwano	[2]
5	Jun Morimoto	[1]
6	Takashi Ohuchi	[3]
7	Hirokazu Saitoh	[1]
8	Mikio Shirai	[3]
9	Takahide Sugiyama	[1]
10	Masanori Usui	[1] [2] [3]

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