M. Ishiko

	2005
1		Stephane Azzopardi, A. Benmansour, M. Ishiko, E. Woirgard: Assessment of the Trench IGBT reliability: low temperature experimental characterization. Microelectronics Reliability 45(9-11): 1700-1705 (2005)

Coauthor Index

1	Stephane Azzopardi	[1]
2	A. Benmansour	[1]
3	Eric Woirgard (E. Woirgard)	[1]

Last update Thu May 31 18:55:10 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page