 | 2011 |
| 20 |  | Joan Font-Rosselló,
Eugeni Isern,
Miquel Roca,
Rodrigo Picos,
Miquel Font-Rosselló,
Eugeni García-Moreno:
Band-Pass Filter Design with Diagnosis Facilities Based on Predictive Techniques.
J. Electronic Testing 27(6): 685-696 (2011) |
| 2010 |
| 19 |  | Kay Suenaga,
Eugeni Isern,
Rodrigo Picos,
Sebastiàn A. Bota,
Miquel Roca,
Eugeni García-Moreno:
Application of Predictive Oscillation-Based Test to a CMOS OpAmp.
IEEE T. Instrumentation and Measurement 59(8): 2076-2082 (2010) |
| 2009 |
| 18 |  | Kay Suenaga,
Sebastiàn A. Bota,
Rodrigo Picos,
Eugeni Isern,
Miquel Roca,
Eugeni García-Moreno:
Predictive Test Technique for Diagnosis of RF CMOS Receivers.
VTS 2009: 129-133 |
| 17 |  | Luz Balado,
Emili Lupon,
Joan Figueras,
Miquel Roca,
Eugeni Isern,
Rodrigo Picos:
Verifying Functional Specifications by Regression Techniques on Lissajous Test Signatures.
IEEE Trans. on Circuits and Systems 56-I(4): 754-762 (2009) |
| 16 |  | Eugeni García-Moreno,
Kay Suenaga,
Rodrigo Picos,
Sebastiàn A. Bota,
Miquel Roca,
Eugeni Isern:
Predictive test strategy for CMOS RF mixers.
Integration 42(1): 95-102 (2009) |
| 2007 |
| 15 |  | Kay Suenaga,
Rodrigo Picos,
Sebastiàn A. Bota,
Miquel Roca,
Eugeni Isern,
Eugenio García:
A Module for BiST of CMOS RF Receivers.
J. Electronic Testing 23(6): 605-612 (2007) |
| 2004 |
| 14 |  | Rodrigo Picos,
Miquel Roca,
Eugeni Isern,
Sebastiàn A. Bota,
Eugenio García:
On-line Monitoring Capabilities of Oscillation Test Techniques: Results Demonstration in an OTA.
IOLTS 2004: 179 |
| 2003 |
| 13 |  | Rodrigo Picos,
Joan Font,
Eugeni Isern,
Miquel Roca,
Eugenio García:
A Configurable Built in Current Sensor for Mixed Signal Circuit Testing.
IOLTS 2003: 167 |
| 12 |  | Eugeni Isern,
Miquel Roca,
Francesc Moll:
Analysis of the Contribution of Interconnect Effects in the Energy Dissipation of VLSI Circuits.
PATMOS 2003: 481-490 |
| 11 |  | Joan Font,
J. Ginard,
Rodrigo Picos,
Eugeni Isern,
Jaume Segura,
Miquel Roca,
Eugenio García:
A BICS for CMOS OpAmps by Monitoring the Supply Current Peak.
J. Electronic Testing 19(5): 597-603 (2003) |
| 10 |  | Joan Font,
Rodrigo Picos,
Miquel Roca,
Eugeni Isern,
Eugeni García-Moreno:
A new BICS for CMOS operational amplifiers by using oscillation test techniques.
Microelectronics Journal 34(10): 919-926 (2003) |
| 9 |  | Francesc Moll,
Miquel Roca,
Eugeni Isern:
Analysis of dissipation energy of switching digital CMOS gates with coupled outputs.
Microelectronics Journal 34(9): 833-842 (2003) |
| 2002 |
| 8 |  | Joan Font,
J. Ginard,
Eugeni Isern,
Miquel Roca,
Jaume Segura,
Eugenio García:
A BICS for CMOS Opamps by Monitoring the Supply Current Peak.
IOLTW 2002: 94-98 |
| 2000 |
| 7 |  | Rodrigo Picos,
Miquel Roca,
Eugeni Isern,
Jaume Segura,
Eugeni García-Moreno:
Experimental Results on BIC Sensors for Transient Current Testing.
J. Electronic Testing 16(3): 235-241 (2000) |
| 1999 |
| 6 |  | Eugeni Isern,
Miquel Roca,
Jaume Segura:
Analyzing the Need for ATPG Targeting GOS Defects.
VTS 1999: 420-425 |
| 1998 |
| 5 |  | Antoni Ferré,
Eugeni Isern,
Josep Rius,
Rosa Rodríguez-Montañés,
Joan Figueras:
IDDQ testing: state of the art and future trends.
Integration 26(1-2): 167-196 (1998) |
| 4 |  | Eugeni García-Moreno,
Benjamín Iñíguez,
Miquel Roca,
Jaume Segura,
Eugeni Isern:
Clocked Dosimeter Compatible with Digital CMOS Technology.
J. Electronic Testing 12(1-2): 101-110 (1998) |
| 1995 |
| 3 |  | Eugeni Isern,
Joan Figueras:
IDDQ Test and Diagnosis of CMOS Circuits.
IEEE Design & Test of Computers 12(4): 60-67 (1995) |
| 1994 |
| 2 |  | Eugeni Isern,
Joan Figueras:
Test of Bridging Faults in Scan-based Sequential Circuits.
EDAC-ETC-EUROASIC 1994: 366-370 |
| 1993 |
| 1 |  | Eugeni Isern,
Joan Figueras:
Test Generation with High Coverages for Quiescent Current Test of Bridging Faults in Combinational Circuits.
ITC 1993: 73-82 |