 | 2008 |
| 3 |  | R. Srnánek,
G. Irmer,
D. Donoval,
J. Osvald,
D. Mc Phail,
A. Christoffi,
B. Sciana,
D. Radziewicz,
M. Tlaczala:
Application of micro-Raman spectroscopy for the evaluation of doping profile in Zn delta-doped GaAs structures.
Microelectronics Journal 39(12): 1439-1443 (2008) |
| 2 |  | R. Srnánek,
G. Irmer,
D. Donoval,
A. Vincze,
B. Sciana,
D. Radziewicz,
M. Tlaczala:
Quantitative analysis of doping profile on beveled p-type GaAs structures by micro-Raman spectroscopy.
Microelectronics Journal 39(12): 1605-1612 (2008) |
| 2006 |
| 1 |  | L. Peternai,
J. Kovác,
G. Irmer,
S. Hasenöhrl,
J. Novák,
R. Srnánek:
Investigation of graded InxGa1-xP buffer by Raman scattering method.
Microelectronics Journal 37(6): 487-490 (2006) |