 | 2011 |
|---|
| 9 |       | M. Riccio,
A. Pantellini,
Andrea Irace,
Giovanni Breglio,
A. Nanni,
C. Lanzieri:
Electro-thermal characterization of AlGaN/GaN HEMT on Silicon Microstrip Technology.
Microelectronics Reliability 51(9-11): 1725-1729 (2011) |
| 2010 |
|---|
| 8 | | Lucio Rossi,
M. Riccio,
E. Napoli,
Andrea Irace,
Giovanni Breglio,
Paolo Spirito:
A novel UIS test system with Crowbar feedback for reduced failure energy in power devices testing.
Microelectronics Reliability 50(9-11): 1479-1483 (2010) |
| 7 | | M. Riccio,
Lucio Rossi,
Andrea Irace,
E. Napoli,
Giovanni Breglio,
Paolo Spirito,
R. Tagami,
Y. Mizuno:
Analysis of large area Trench-IGBT current distribution under UIS test with the aid of lock-in thermography.
Microelectronics Reliability 50(9-11): 1725-1730 (2010) |
| 2009 |
|---|
| 6 | | Lucio Rossi,
M. Riccio,
E. Napoli,
Andrea Irace,
Giovanni Breglio,
Paolo Spirito:
1300 V, 2 ms pulse inductive load switching test circuit with 20 ns selectable crowbar intervention.
Microelectronics Reliability 49(9-11): 1386-1390 (2009) |
| 2008 |
|---|
| 5 | | Giovanni Breglio,
Andrea Irace,
E. Napoli,
M. Riccio,
Paolo Spirito,
K. Hamada,
T. Nishijima,
T. Ueta:
Detection of localized UIS failure on IGBTs with the aid of lock-in thermography.
Microelectronics Reliability 48(8-9): 1432-1434 (2008) |
| 2007 |
|---|
| 4 | | Andrea Irace,
Giovanni Breglio,
Paolo Spirito:
New developments of THERMOS3, a tool for 3D electro-thermal simulation of smart power MOSFETs.
Microelectronics Reliability 47(9-11): 1696-1700 (2007) |
| 3 | | Giovanni Breglio,
Andrea Irace,
E. Napoli,
Paolo Spirito,
K. Hamada,
T. Nishijima,
T. Ueta:
Study of a failure mechanism during UIS switching of planar PT-IGBT with current sense cell.
Microelectronics Reliability 47(9-11): 1756-1760 (2007) |
| 2006 |
|---|
| 2 | | Andrea Irace,
Giovanni Breglio,
Paolo Spirito,
A. Bricconi,
D. Raffo,
L. Merlin:
Effect of a buffer layer in the epi-substrate region to boost the avalanche capability of a 100V Schottky diode.
Microelectronics Reliability 46(9-11): 1784-1789 (2006) |
| 2005 |
|---|
| 1 | | Andrea Irace,
Giovanni Breglio,
Paolo Spirito,
Romeo Letor,
Sebastiano Russo:
Reliability enhancement with the aid of transient infrared thermal analysis of smart Power MOSFETs during short circuit operation.
Microelectronics Reliability 45(9-11): 1706-1710 (2005) |
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