D. E. Ioannou

	2001
1		W. T. Anderson, J. A. Roussos, J. A. Mittereder, D. E. Ioannou, C. Moglestue: Pseudomorphic high electron mobility transistor monolithic microwave integrated circuits reliability study. Microelectronics Reliability 41(8): 1109-1113 (2001)

Coauthor Index

1	W. T. Anderson	[1]
2	J. A. Mittereder	[1]
3	C. Moglestue	[1]
4	J. A. Roussos	[1]

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