 | 2012 |
| 11 |  | Breeta SenGupta,
Urban Ingelsson,
Erik Larsson:
Test Planning for Core-based 3D Stacked ICs with Through-Silicon Vias.
VLSI Design 2012: 442-447 |
| 10 |  | Breeta SenGupta,
Urban Ingelsson,
Erik Larsson:
Scheduling Tests for 3D Stacked Chips under Power Constraints.
J. Electronic Testing 28(1): 121-135 (2012) |
| 2011 |
| 9 |  | Farrokh Ghani Zadegan,
Urban Ingelsson,
Golnaz Asani,
Gunnar Carlsson,
Erik Larsson:
Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints.
Asian Test Symposium 2011: 525-531 |
| 8 |  | Farrokh Ghani Zadegan,
Urban Ingelsson,
Gunnar Carlsson,
Erik Larsson:
Design automation for IEEE P1687.
DATE 2011: 1412-1417 |
| 7 |  | Urban Ingelsson,
Shih-Yen Chang,
Erik Larsson:
Measurement point selection for in-operation wear-out monitoring.
DDECS 2011: 381-386 |
| 6 |  | Urban Ingelsson,
Bashir M. Al-Hashimi:
Investigation into voltage and process variation-aware manufacturing test.
ITC 2011: 1-10 |
| 2010 |
| 5 |  | Mudassar Majeed,
Daniel Ahlstrom,
Urban Ingelsson,
Gunnar Carlsson,
Erik Larsson:
Efficient Embedding of Deterministic Test Data.
Asian Test Symposium 2010: 159-162 |
| 4 |  | Farrokh Ghani Zadegan,
Urban Ingelsson,
Gunnar Carlsson,
Erik Larsson:
Test Time Analysis for IEEE P1687.
Asian Test Symposium 2010: 455-460 |
| 3 |  | Dimitar Nikolov,
Urban Ingelsson,
Virendra Singh,
Erik Larsson:
Estimating Error-probability and its Application for Optimizing Roll-back Recovery with Checkpointing.
DELTA 2010: 281-285 |
| 2009 |
| 2 |  | Urban Ingelsson,
Bashir M. Al-Hashimi,
S. Saqib Khursheed,
Sudhakar M. Reddy,
Peter Harrod:
Process Variation-Aware Test for Resistive Bridges.
IEEE Trans. on CAD of Integrated Circuits and Systems 28(8): 1269-1274 (2009) |
| 2008 |
| 1 |  | S. Saqib Khursheed,
Urban Ingelsson,
Paul M. Rosinger,
Bashir M. Al-Hashimi,
Peter Harrod:
Bridging Fault Test Method With Adaptive Power Management Awareness.
IEEE Trans. on CAD of Integrated Circuits and Systems 27(6): 1117-1127 (2008) |