Michael E. Imhof

	2011
11		Abdullah Mumtaz, Michael E. Imhof, Stefan Holst, Hans-Joachim Wunderlich: Embedded Test for Highly Accurate Defect Localization. Asian Test Symposium 2011: 213-218
10		Michael E. Imhof, Hans-Joachim Wunderlich: Soft error correction in embedded storage elements. IOLTS 2011: 169-174
9		Abdullah Mumtaz, Michael E. Imhof, Hans-Joachim Wunderlich: P-PET: Partial pseudo-exhaustive test for high defect coverage. ITC 2011: 1-8
8		Rafal Baranowski, Stefano Di Carlo, Nadereh Hatami, Michael E. Imhof, Michael A. Kochte, Paolo Prinetto, Hans-Joachim Wunderlich, Christian G. Zoellin: Efficient multi-level fault simulation of HW/SW systems for structural faults. SCIENCE CHINA Information Sciences 54(9): 1784-1796 (2011)
	2010
7		Michael A. Kochte, Christian G. Zoellin, Rafal Baranowski, Michael E. Imhof, Hans-Joachim Wunderlich, Nadereh Hatami, Stefano Di Carlo, Paolo Prinetto: Efficient Simulation of Structural Faults for the Reliability Evaluation at System-Level. Asian Test Symposium 2010: 3-8
6		Michael A. Kochte, Christian G. Zoellin, Rafal Baranowski, Michael E. Imhof, Hans-Joachim Wunderlich, Nadereh Hatami, Stefano Di Carlo, Paolo Prinetto: System reliability evaluation using concurrent multi-level simulation of structural faults. ITC 2010: 817
	2009
5		Michael A. Kochte, Christian G. Zoellin, Michael E. Imhof, Rauf Salimi Khaligh, Martin Radetzki, Hans-Joachim Wunderlich, Stefano Di Carlo, Paolo Prinetto: Test exploration and validation using transaction level models. DATE 2009: 1250-1253
	2008
4		Melanie Elm, Hans-Joachim Wunderlich, Michael E. Imhof, Christian G. Zoellin, Jens Leenstra, Nicolas Mäding: Scan chain clustering for test power reduction. DAC 2008: 828-833
3		Michael A. Kochte, Christian G. Zoellin, Michael E. Imhof, Hans-Joachim Wunderlich: Test Set Stripping Limiting the Maximum Number of Specified Bits. DELTA 2008: 581-586
2		Michael E. Imhof, Hans-Joachim Wunderlich, Christian G. Zoellin: Integrating Scan Design and Soft Error Correction in Low-Power Applications. IOLTS 2008: 59-64
	2007
1		Michael E. Imhof, Christian G. Zoellin, Hans-Joachim Wunderlich, Nicolas Mäding, Jens Leenstra: Scan Test Planning for Power Reduction. DAC 2007: 521-526

Coauthor Index

1	Rafal Baranowski	[6] [7] [8]
2	Stefano Di Carlo	[5] [6] [7] [8]
3	Melanie Elm	[4]
4	Nadereh Hatami	[6] [7] [8]
5	Stefan Holst	[11]
6	Rauf Salimi Khaligh	[5]
7	Michael A. Kochte	[3] [5] [6] [7] [8]
8	Jens Leenstra	[1] [4]
9	Nicolas Mäding	[1] [4]
10	Abdullah Mumtaz	[9] [11]
11	Paolo Prinetto	[5] [6] [7] [8]
12	Martin Radetzki	[5]
13	Hans-Joachim Wunderlich	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11]
14	Christian G. Zoellin	[1] [2] [3] [4] [5] [6] [7] [8]

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