Susumu Imaoka

	2005
1		Yasumasa Tsukamoto, Koji Nii, Susumu Imaoka, Yuji Oda, Shigeki Ohbayashi, Tomoaki Yoshizawa, Hiroshi Makino, Koichiro Ishibashi, Hirofumi Shinohara: Worst-case analysis to obtain stable read/write DC margin of high density 6T-SRAM-array with local Vth variability. ICCAD 2005: 398-405

Coauthor Index

1	Koichiro Ishibashi	[1]
2	Hiroshi Makino	[1]
3	Koji Nii	[1]
4	Yuji Oda	[1]
5	Shigeki Ohbayashi	[1]
6	Hirofumi Shinohara	[1]
7	Yasumasa Tsukamoto	[1]
8	Tomoaki Yoshizawa	[1]

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