Jung-Been Im

	2006
2		Sunghoon Chun, YongJoon Kim, Jung-Been Im, Sungho Kang: MICRO: a new hybrid test data compression/decompression scheme. IEEE Trans. VLSI Syst. 14(6): 649-654 (2006)
	2004
1		Jung-Been Im, Sunghoon Chun, Geunbae Kim, Jin-Ho Ahn, Sungho Kang: RAIN (RAndom Insertion) Scheduling Algorithm for SoC Test. Asian Test Symposium 2004: 242-247

Coauthor Index

1	Jin-Ho Ahn	[1]
2	Sunghoon Chun	[1] [2]
3	Sungho Kang	[1] [2]
4	Geunbae Kim	[1]
5	YongJoon Kim	[2]

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