M. Ikegami

	2001
1		M. Nakabayashi, H. Ohyama, Eddy Simoen, M. Ikegami, Cor Claeys, K. Kobayashi, M. Yoneoka, K. Miyahara: Reliability of polycrystalline silicon thin film resistors. Microelectronics Reliability 41(9-10): 1341-1346 (2001)

Coauthor Index

1	Cor Claeys	[1]
2	K. Kobayashi	[1]
3	K. Miyahara	[1]
4	M. Nakabayashi	[1]
5	H. Ohyama	[1]
6	Eddy Simoen	[1]
7	M. Yoneoka	[1]

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