Mitsuji Ikeda

	1997
3		Kazumi Hatayama, Mitsuji Ikeda, Masahiro Takakura, Satoshi Uchiyama, Yoriyuki Sakamoto: Application of a Design for Delay Testability Approach to High Speed Logic LSIs. Asian Test Symposium 1997: 112-115
	1992
2		Kazumi Hatayama, Kazunori Hikone, Mitsuji Ikeda, Terumine Hayashi: Sequential Test Generation Based on Real-Value Logic. ITC 1992: 41-48
	1989
1		Kazumi Hatayama, Mitsuji Ikeda, Terumine Hayashi, Masahiro Takakura, Kuniaki Kishida, Shun Ishiyama: Enhanced Delay Test Generator for High-Speed Logic LSIs. ITC 1989: 161-165

Coauthor Index

1	Kazumi Hatayama	[1] [2] [3]
2	Terumine Hayashi	[1] [2]
3	Kazunori Hikone	[2]
4	Shun Ishiyama	[1]
5	Kuniaki Kishida	[1]
6	Yoriyuki Sakamoto	[3]
7	Masahiro Takakura	[1] [3]
8	Satoshi Uchiyama	[3]

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