Hidehiro Ikeda

	1998
1		Atsushi Shimoda, Hisafumi Iwata, Yukihiro Shibata, Hidehiro Ikeda: Thin Film Magnetic Head Wafer Inspection Technique Using Geometrical Feature Based Image Comparison. MVA 1998: 531-534

Coauthor Index

1	Hisafumi Iwata	[1]
2	Yukihiro Shibata	[1]
3	Atsushi Shimoda	[1]

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