 | 2012 |
| 19 |  | Tetsuya Iizuka,
Kunihiro Asada:
All-Digital PMOS and NMOS Process Variability Monitor Utilizing Shared Buffer Ring and Ring Oscillator.
IEICE Transactions 95-C(4): 627-634 (2012) |
| 18 |  | Tetsuya Iizuka,
Satoshi Miura,
Ryota Yamamoto,
Yutaka Chiba,
Shunichi Kubo,
Kunihiro Asada:
A 580 fs-Resolution Time-to-Digital Converter Utilizing Differential Pulse-Shrinking Buffer Ring in 0.18 µm CMOS Technology.
IEICE Transactions 95-C(4): 661-667 (2012) |
| 2011 |
| 17 |  | Jaehyun Jeong,
Tetsuya Iizuka,
Toru Nakura,
Makoto Ikeda,
Kunihiro Asada:
All-digital PMOS and NMOS process variability monitor utilizing buffer ring with pulse counter.
ASP-DAC 2011: 79-80 |
| 16 |  | Tetsuya Iizuka,
Kunihiro Asada:
An all-digital on-chip PMOS and NMOS process variability monitor utilizing shared buffer ring and ring oscillator.
DDECS 2011: 115-120 |
| 15 |  | Kazutoshi Kodama,
Tetsuya Iizuka,
Kunihiro Asada:
A high frequency resolution Digitally-Controlled Oscillator using single-period switching scheme.
ESSCIRC 2011: 399-402 |
| 14 |  | Tetsuya Iizuka,
Jaehyun Jeong,
Toru Nakura,
Makoto Ikeda,
Kunihiro Asada:
All-Digital On-Chip Monitor for PMOS and NMOS Process Variability Utilizing Buffer Ring with Pulse Counter.
IEICE Transactions 94-C(4): 487-494 (2011) |
| 13 |  | Shingo Mandai,
Toru Nakura,
Tetsuya Iizuka,
Makoto Ikeda,
Kunihiro Asada:
Cascaded Time Difference Amplifier with Differential Logic Delay Cell.
IEICE Transactions 94-C(4): 654-662 (2011) |
| 12 |  | Shingo Mandai,
Tetsuya Iizuka,
Toru Nakura,
Makoto Ikeda,
Kunihiro Asada:
1.0 ps Resolution Time-to-Digital Converter Based-On Cascaded Time-Difference-Amplifier Utilizing Differential Logic Delay Cells.
IEICE Transactions 94-C(6): 1098-1104 (2011) |
| 2010 |
| 11 |  | Tetsuya Iizuka,
Toru Nakura,
Kunihiro Asada:
Buffer-ring-based all-digital on-chip monitor for PMOS and NMOS process variability and aging effects.
DDECS 2010: 167-172 |
| 2007 |
| 10 |  | Tetsuya Iizuka,
Makoto Ikeda,
Kunihiro Asada:
OPC-Friendly De-Compaction with Timing Constraints for Standard Cell Layouts.
ISQED 2007: 776-781 |
| 9 |  | Tetsuya Iizuka,
Makoto Ikeda,
Kunihiro Asada:
Timing-Aware Cell Layout De-Compaction for Yield Optimization by Critical Area Minimization.
IEEE Trans. VLSI Syst. 15(6): 716-720 (2007) |
| 2006 |
| 8 |  | Tetsuya Iizuka,
Makoto Ikeda,
Kunihiro Asada:
Timing-driven cell layout de-compaction for yield optimization by critical area minimization.
DATE 2006: 884-889 |
| 7 |  | Tetsuya Iizuka,
Makoto Ikeda,
Kunihiro Asada:
Exact minimum-width multi-row transistor placement for dual and non-dual CMOS cells.
ISCAS 2006 |
| 2005 |
| 6 |  | Tetsuya Iizuka,
Makoto Ikeda,
Kunihiro Asada:
Exact minimum-width transistor placement without dual constraint for CMOS cells.
ACM Great Lakes Symposium on VLSI 2005: 74-77 |
| 5 |  | Tetsuya Iizuka,
Makoto Ikeda,
Kunihiro Asada:
Exact Minimum-Width Transistor Placement for Dual and Non-dual CMOS Cells.
IEICE Transactions 88-A(12): 3485-3491 (2005) |
| 4 |  | Tetsuya Iizuka,
Makoto Ikeda,
Kunihiro Asada:
Yield-Optimal Layout Synthesis of CMOS Logic Cells by Wiring Fault Minimization.
IEICE Transactions 88-A(7): 1957-1963 (2005) |
| 2004 |
| 3 |  | Tetsuya Iizuka,
Makoto Ikeda,
Kunihiro Asada:
High speed layout synthesis for minimum-width CMOS logic cells via Boolean satisfiability.
ASP-DAC 2004: 149-154 |
| 2 |  | Tetsuya Iizuka,
Makoto Ikeda,
Kunihiro Asada:
Exact Wiring Fault Minimization via Comprehensive Layout Synthesis for CMOS Logic Cells.
ISQED 2004: 377-380 |
| 1998 |
| 1 |  | Yuichi Iizuka,
Hisako Shiohara,
Tetsuya Iizuka,
Seiji Isobe:
Automatic Visualization Method for Visual Data Mining.
PAKDD 1998: 173-185 |