M.-A. Iannello

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2005

1 M.-A. Iannello, L. Tsung: STEM role in failure analysis. Microelectronics Reliability 45(9-11): 1526-1531 (2005)

	2005
1		M.-A. Iannello, L. Tsung: STEM role in failure analysis. Microelectronics Reliability 45(9-11): 1526-1531 (2005)

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