 | 2007 |
|---|
| 5 |       | Robert F. Molyneaux,
Thomas A. Ziaja,
Hong Kim,
Shahryar Aryani,
Sungbae Hwang,
Alex Hsieh:
Design for testability features of the SUN microsystems niagara2 CMP/CMT SPARC chip.
ITC 2007: 1-8 |
| 2003 |
|---|
| 4 | | Hak-soo Yu,
Sungbae Hwang,
Jacob A. Abraham:
DSP-Based Statistical Self Test of On-Chip Converters.
VTS 2003: 83-88 |
| 3 | | Sungbae Hwang,
Jacob A. Abraham:
Test data compression and test time reduction using an embedded microprocessor.
IEEE Trans. VLSI Syst. 11(5): 853-862 (2003) |
| 2002 |
|---|
| 2 | | Sungbae Hwang,
Jacob A. Abraham:
Selective-run built-in self-test using an embedded processor.
ACM Great Lakes Symposium on VLSI 2002: 124-129 |
| 1 | | Sungbae Hwang,
Jacob A. Abraham:
Optimal BIST Using an Embedded Microprocessor.
ITC 2002: 736-745 |
Data released under the ODC-BY 1.0 license — See also our legal information page